- Stripe and ring artifact removal with combined wavelet--Fourier filteringBeat Münch
EMPA Materials Science and Technology, Dubendorf, Switzerland
Opt Express 17:8567-91. 2009....
- Toward reproducible three-dimensional microstructure analysis of granular materials and complex suspensionsLorenz Holzer
EMPA Materials Science and Technology, 8600 Dubendorf, Switzerland
Microsc Microanal 15:130-46. 2009..At low magnifications the small particles and their surface area are underestimated. At high magnifications representativity is questioned because local inhomogeneities can become dominant...