Joan Vila-Comamala

Summary

Affiliation: Paul Scherrer Institute
Country: Switzerland

Publications

  1. doi Advanced thin film technology for ultrahigh resolution X-ray microscopy
    Joan Vila-Comamala
    Paul Scherrer Institut, CH 5232 Villigen, Switzerland
    Ultramicroscopy 109:1360-4. 2009
  2. doi Dense high aspect ratio hydrogen silsesquioxane nanostructures by 100 keV electron beam lithography
    Joan Vila-Comamala
    Paul Scherrer Institut, Villigen CH 5232, Switzerland
    Nanotechnology 21:285305. 2010
  3. doi Ultra-high resolution zone-doubled diffractive X-ray optics for the multi-keV regime
    Joan Vila-Comamala
    Paul Scherrer Institut, Villigen, Switzerland
    Opt Express 19:175-84. 2011
  4. doi Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging
    Joan Vila-Comamala
    Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
    Opt Express 19:21333-44. 2011
  5. pmc Angular spectrum simulation of X-ray focusing by Fresnel zone plates
    Joan Vila-Comamala
    Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
    J Synchrotron Radiat 20:397-404. 2013
  6. pmc High-efficiency Fresnel zone plates for hard X-rays by 100 keV e-beam lithography and electroplating
    Sergey Gorelick
    Paul Scherrer Institut, CH 5232 Villigen, Switzerland
    J Synchrotron Radiat 18:442-6. 2011
  7. doi Direct e-beam writing of dense and high aspect ratio nanostructures in thick layers of PMMA for electroplating
    Sergey Gorelick
    Paul Scherrer Institut, CH 5232 Villigen PSI, Switzerland
    Nanotechnology 21:295303. 2010
  8. doi Reconstruction of an astigmatic hard X-ray beam and alignment of K-B mirrors from ptychographic coherent diffraction data
    Cameron M Kewish
    Paul Scherrer Institut, CH 5232 Villigen PSI, Switzerland
    Opt Express 18:23420-7. 2010
  9. doi Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics
    Cameron M Kewish
    Paul Scherrer Institut, CH 5232 Villigen PSI, Switzerland
    Ultramicroscopy 110:325-9. 2010
  10. pmc Zone-doubled Fresnel zone plates for high-resolution hard X-ray full-field transmission microscopy
    Joan Vila-Comamala
    Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
    J Synchrotron Radiat 19:705-9. 2012

Collaborators

  • Manuel Guizar-Sicairos
  • Pierre Thibault
  • Sergey Gorelick
  • Cameron M Kewish
  • Christian David
  • Vitaliy A Guzenko
  • Oliver Bunk
  • Ray Barrett
  • Murielle Salomé
  • Andreas Menzel
  • Christa Benson
  • James R Fienup
  • Bing Shi
  • Lahsen Assoufid
  • Konstantins Jefimovs
  • Franz Pfeiffer
  • Ali M Khounsary
  • Martin Dierolf
  • Chian Liu
  • Jun Qian
  • Albert T Macrander

Detail Information

Publications10

  1. doi Advanced thin film technology for ultrahigh resolution X-ray microscopy
    Joan Vila-Comamala
    Paul Scherrer Institut, CH 5232 Villigen, Switzerland
    Ultramicroscopy 109:1360-4. 2009
    ..2 keV photon energy using line pair structures of a sample prepared by metal organic vapor phase epitaxy. For the first time in X-ray microscopy, features below 10nm in width were resolved...
  2. doi Dense high aspect ratio hydrogen silsesquioxane nanostructures by 100 keV electron beam lithography
    Joan Vila-Comamala
    Paul Scherrer Institut, Villigen CH 5232, Switzerland
    Nanotechnology 21:285305. 2010
    ..We used these methods to produce Fresnel zone plates with extreme aspect ratio for scanning transmission x-ray microscopy that showed excellent performance at 1.0 keV photon energy...
  3. doi Ultra-high resolution zone-doubled diffractive X-ray optics for the multi-keV regime
    Joan Vila-Comamala
    Paul Scherrer Institut, Villigen, Switzerland
    Opt Express 19:175-84. 2011
    ..5% at 6.2 keV photon energy. These developments represent a significant step towards 10 nm spatial resolution for hard X-ray energies of up to 12 keV...
  4. doi Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging
    Joan Vila-Comamala
    Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
    Opt Express 19:21333-44. 2011
    ..006 waves, and we demonstrate that they can be related to manufacturing aspects of the diffractive optical element and to errors on the incident X-ray wavefront introduced by the upstream beamline optics...
  5. pmc Angular spectrum simulation of X-ray focusing by Fresnel zone plates
    Joan Vila-Comamala
    Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
    J Synchrotron Radiat 20:397-404. 2013
    ..Opt. Soc. Am. A, (2004), 21, 53-58]. In particular, the code has been used to investigate the requirements for the stacking of two high-resolution Fresnel zone plates with an outermost zone width of 20 nm...
  6. pmc High-efficiency Fresnel zone plates for hard X-rays by 100 keV e-beam lithography and electroplating
    Sergey Gorelick
    Paul Scherrer Institut, CH 5232 Villigen, Switzerland
    J Synchrotron Radiat 18:442-6. 2011
    ..8-13.2 keV) showing excellent values up to 65-75% of the theoretical values, reflecting the good quality of the FZPs. Spatially resolved diffraction efficiency measurements indicate the uniformity of the FZPs and a defect-free structure...
  7. doi Direct e-beam writing of dense and high aspect ratio nanostructures in thick layers of PMMA for electroplating
    Sergey Gorelick
    Paul Scherrer Institut, CH 5232 Villigen PSI, Switzerland
    Nanotechnology 21:295303. 2010
    ..1 microm thick PMMA molds. In addition, we also produced regular arrays of high aspect ratio and dense Au nanorods with periods down to 100 nm and high aspect ratio split-ring resonators...
  8. doi Reconstruction of an astigmatic hard X-ray beam and alignment of K-B mirrors from ptychographic coherent diffraction data
    Cameron M Kewish
    Paul Scherrer Institut, CH 5232 Villigen PSI, Switzerland
    Opt Express 18:23420-7. 2010
    ....
  9. doi Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics
    Cameron M Kewish
    Paul Scherrer Institut, CH 5232 Villigen PSI, Switzerland
    Ultramicroscopy 110:325-9. 2010
    ..Ptychography will therefore be well-suited for characterizing and aligning future nanofocusing X-ray optics...
  10. pmc Zone-doubled Fresnel zone plates for high-resolution hard X-ray full-field transmission microscopy
    Joan Vila-Comamala
    Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
    J Synchrotron Radiat 19:705-9. 2012
    ....