Lionel R Watkins

Summary

Affiliation: University of Auckland
Country: New Zealand

Publications

  1. doi request reprint Spectroscopic null ellipsometer using a variable retarder
    Lionel R Watkins
    Department of Physics, University of Auckland, P B 92019, Auckland, New Zealand
    Appl Opt 50:50-2. 2011
  2. ncbi request reprint Interferometric ellipsometer
    Lionel R Watkins
    Department of Physics, University of Auckland, Auckland, New Zealand
    Appl Opt 47:2998-3001. 2008
  3. ncbi request reprint Interferometric ellipsometer with wavelength-modulated laser diode source
    Lionel R Watkins
    Department of Physics, University of Auckland, Private Bag, Auckland, New Zealand
    Appl Opt 43:4362-6. 2004
  4. doi request reprint Automatic null ellipsometry with an interferometer
    Lionel R Watkins
    Department of Physics, University of Auckland, P B 92019, Auckland, New Zealand
    Appl Opt 48:6277-80. 2009
  5. doi request reprint Variable angle of incidence spectroscopic autocollimating ellipsometer
    Lionel R Watkins
    Department of Physics, University of Auckland P B 92019, Auckland, New Zealand
    Appl Opt 49:3231-4. 2010
  6. doi request reprint White-light ellipsometer with geometric phase shifter
    Lionel R Watkins
    Department of Physics, University of Auckland, Auckland, New Zealand
    Appl Opt 51:5060-5. 2012
  7. doi request reprint Spectroscopic ellipsometer based on direct measurement of polarization ellipticity
    Lionel R Watkins
    Department of Physics, University of Auckland, P B 92019, Auckland, New Zealand
    Appl Opt 50:2973-8. 2011
  8. ncbi request reprint Ellipsometry with polarisation-entangled photons
    David J L Graham
    Department of Physics, The University of Auckland, Private Bag 92019, Auckland, New Zealand
    Opt Express 14:7037-45. 2006

Collaborators

  • David J L Graham
  • A Scott Parkins

Detail Information

Publications8

  1. doi request reprint Spectroscopic null ellipsometer using a variable retarder
    Lionel R Watkins
    Department of Physics, University of Auckland, P B 92019, Auckland, New Zealand
    Appl Opt 50:50-2. 2011
    ....
  2. ncbi request reprint Interferometric ellipsometer
    Lionel R Watkins
    Department of Physics, University of Auckland, Auckland, New Zealand
    Appl Opt 47:2998-3001. 2008
    ..Estimates of the noise performance indicate a precision, in air, of approximately 41 pm...
  3. ncbi request reprint Interferometric ellipsometer with wavelength-modulated laser diode source
    Lionel R Watkins
    Department of Physics, University of Auckland, Private Bag, Auckland, New Zealand
    Appl Opt 43:4362-6. 2004
    ..Temperature tuning the laser diode center wavelength allows the frequency dependence of the optical properties to be determined over a wavelength range of approximately 1 nm...
  4. doi request reprint Automatic null ellipsometry with an interferometer
    Lionel R Watkins
    Department of Physics, University of Auckland, P B 92019, Auckland, New Zealand
    Appl Opt 48:6277-80. 2009
    ..Measurements made with this instrument on a native oxide film on a silicon wafer were in excellent agreement with those made with a traditional PCSA null ellipsometer...
  5. doi request reprint Variable angle of incidence spectroscopic autocollimating ellipsometer
    Lionel R Watkins
    Department of Physics, University of Auckland P B 92019, Auckland, New Zealand
    Appl Opt 49:3231-4. 2010
    ....
  6. doi request reprint White-light ellipsometer with geometric phase shifter
    Lionel R Watkins
    Department of Physics, University of Auckland, Auckland, New Zealand
    Appl Opt 51:5060-5. 2012
    ..Two silicon dioxide films were measured with this instrument between 450 and 850 nm and yielded best fit film thicknesses of 1000.6±0.1 Å and 20.6±0.1 Å, in excellent agreement with those obtained using a commercial ellipsometer...
  7. doi request reprint Spectroscopic ellipsometer based on direct measurement of polarization ellipticity
    Lionel R Watkins
    Department of Physics, University of Auckland, P B 92019, Auckland, New Zealand
    Appl Opt 50:2973-8. 2011
    ..The best fit film thicknesses obtained were in excellent agreement with those determined using a traditional null ellipsometer...
  8. ncbi request reprint Ellipsometry with polarisation-entangled photons
    David J L Graham
    Department of Physics, The University of Auckland, Private Bag 92019, Auckland, New Zealand
    Opt Express 14:7037-45. 2006
    ..The ellipsometric angles are readily calculated from these components and experimental measurements made on the samples were found to be in good agreement with their expected values...