Victor Yurlov

Summary

Affiliation: Sungkyunkwan University School of Medicine
Country: Korea

Publications

  1. ncbi request reprint Speckle suppression in scanning laser display
    Victor Yurlov
    Samsung Electro Mechanics Company, Ltd, Korea
    Appl Opt 47:179-87. 2008
  2. doi request reprint Line-defect calibration for line-scanning projection display
    Seungdo An
    SOM R and D and Biz Group, OS Division, Samsung Electro Mechanics Co, Ltd, Suwon 442 743, Korea
    Opt Express 17:16492-504. 2009
  3. ncbi request reprint Speckle suppression in laser display using several partially coherent beams
    Seungdo An
    OS Division, SOM R and D and Biz Group, Samsung Electro Mechanics Co, Ltd, Suwon, Korea
    Opt Express 17:92-103. 2009
  4. ncbi request reprint Numerical simulation of characteristics of near-field microstrip probe having pyramidal shape
    Anatoly S Lapchuk
    Central R and D Institute, Samsung Electro Mechanics Company, Ltd, Suwon, Korea
    J Opt Soc Am A Opt Image Sci Vis 24:2407-17. 2007

Detail Information

Publications4

  1. ncbi request reprint Speckle suppression in scanning laser display
    Victor Yurlov
    Samsung Electro Mechanics Company, Ltd, Korea
    Appl Opt 47:179-87. 2008
    ....
  2. doi request reprint Line-defect calibration for line-scanning projection display
    Seungdo An
    SOM R and D and Biz Group, OS Division, Samsung Electro Mechanics Co, Ltd, Suwon 442 743, Korea
    Opt Express 17:16492-504. 2009
    ..In this report, we present a calibration method using a recursively converging algorithm that successfully transforms the unacceptable line-defected images into a uniform display image...
  3. ncbi request reprint Speckle suppression in laser display using several partially coherent beams
    Seungdo An
    OS Division, SOM R and D and Biz Group, Samsung Electro Mechanics Co, Ltd, Suwon, Korea
    Opt Express 17:92-103. 2009
    ..Verification of speckle suppression using three-beam decorrelation is reported...
  4. ncbi request reprint Numerical simulation of characteristics of near-field microstrip probe having pyramidal shape
    Anatoly S Lapchuk
    Central R and D Institute, Samsung Electro Mechanics Company, Ltd, Suwon, Korea
    J Opt Soc Am A Opt Image Sci Vis 24:2407-17. 2007
    ..These high parameters imply that both types of microstrip probe may be utilized for optical and magnetic data storage, nanolithography, and other types of nanotechnology that use light for modification of a thin surface layer...