- Line-defect calibration for line-scanning projection displaySeungdo An
SOM R and D and Biz Group, OS Division, Samsung Electro Mechanics Co, Ltd, Suwon 442 743, Korea
Opt Express 17:16492-504. 2009..In this report, we present a calibration method using a recursively converging algorithm that successfully transforms the unacceptable line-defected images into a uniform display image...
- Speckle suppression in laser display using several partially coherent beamsSeungdo An
OS Division, SOM R and D and Biz Group, Samsung Electro Mechanics Co, Ltd, Suwon, Korea
Opt Express 17:92-103. 2009..Verification of speckle suppression using three-beam decorrelation is reported...
- Numerical simulation of characteristics of near-field microstrip probe having pyramidal shapeAnatoly S Lapchuk
Central R and D Institute, Samsung Electro Mechanics Company, Ltd, Suwon, Korea
J Opt Soc Am A Opt Image Sci Vis 24:2407-17. 2007..These high parameters imply that both types of microstrip probe may be utilized for optical and magnetic data storage, nanolithography, and other types of nanotechnology that use light for modification of a thin surface layer...