Claude Amra

Summary

Affiliation: Institut Fresnel
Country: France

Publications

  1. ncbi request reprint Efficiency of polarimetric z probing in optical multilayers
    Claude Amra
    Institut Fresnel, Unite Mixte de Recherche, Centre National de la Recherche Scientifique T2I 6133, Universite Paul Cezanne, Universite de Provence, Faculté des Sciences et Techniques de St Jérôme, Marseille Cedex 20, France
    Appl Opt 47:C279-83. 2008
  2. ncbi request reprint Z-probing of optical multilayers: theory
    Claude Amra
    Institut Fresnel Marseille, UMR CNRSTIC, Universite Paul Cezanne, Ecole Génealiste Ingénieurs Marseille, Cedex, France
    Opt Lett 31:2704-6. 2006
  3. ncbi request reprint Partial polarization of light induced by random defects at surfaces or bulks
    Claude Amra
    Institut Fresnel, UMR CNRS 6133, Aix Marseille Universités, Ecole Centrale MarseilleFaculté des Sciences et Techniques de St Jérôme, 13397 Marseille Cedex 20, France
    Opt Express 16:10372-83. 2008
  4. ncbi request reprint From angle-resolved ellipsometry of light scattering to imaging in random media
    Gaelle Georges
    Institut Fresnel, Unite Mixte de Recherche, Centre National de la Recherche Scientifique ST2I 6133, Universite Paul Cezanne, Universite de Provence, Faculté des Sciences et Techniques de St Jérôme, Marseille Cedex 20, France
    Appl Opt 47:C257-65. 2008
  5. ncbi request reprint Optical characterization of an unknown single layer: Institut Fresnel contribution to the Optical Interference Coatings 2004 Topical Meeting Measurement Problem
    Fabien Lemarchand
    Institut Fresnel UMR CNRS 6133, Universite Paul Cezanne, Domaine Universitaire de Saint Jerome, 13397 Marseille Cedex 20, France
    Appl Opt 45:1312-8. 2006
  6. ncbi request reprint Piezoelectric tantalum pentoxide studied for optical tunable applications
    Rémy Parmentier
    Institut Fresnel, Unite Mixte de Recherche, Centre National de la Recherche Scientifique 6133, Ecole Nationale Supérieure de Physique de Marseille, Domaine Universitaire de Saint Jérĵme, France
    Appl Opt 41:3270-6. 2002
  7. ncbi request reprint Ellipsometry of reflected and scattered fields for the analysis of substrate optical quality
    Carole Deumié
    Institut Fresnel, Ecole Généraliste d Ingénieurs de Marseille, Universite Paul Cezanne Aix Marseille III, Université de Provence Aix Marseille I, Domaine universitaire de St Jerome, France
    Appl Opt 45:1640-9. 2006
  8. ncbi request reprint Light-scattering characterization of transparent substrates
    Myriam Zerrad
    Institut Fresnel, Unité Mixte de Recherche CNRSTIC 6133, Ecole Généraliste d Ingénieurs de Marseille, Université Paul Cézanne Aix Marseille I, Domaine universitaire de St Jerome, 13397 Marseille Cedex 20, France
    Appl Opt 45:1402-9. 2006
  9. ncbi request reprint Toward tunable thin-film filters for wavelength division multiplexing applications
    Michel Lequime
    Institut Fresnel, Unite Mixte de Recherche 6133, Centre National de la Recherche Scientifique, Ecole Nationale Supérieure de Physique de Marseille, Domaine Universitaire de Saint Jérĵme, France
    Appl Opt 41:3277-84. 2002
  10. ncbi request reprint Statistical signatures of random media and their correlation to polarization properties
    Jacques Sorrentini
    Institut Fresnel CNRS, Universités d Aix Marseille, Ecole Centrale Marseille, Domaine Universitaire de Saint Jerome, 13397 Marseille Cedex 20, France
    Opt Lett 34:2429-31. 2009

Collaborators

Detail Information

Publications19

  1. ncbi request reprint Efficiency of polarimetric z probing in optical multilayers
    Claude Amra
    Institut Fresnel, Unite Mixte de Recherche, Centre National de la Recherche Scientifique T2I 6133, Universite Paul Cezanne, Universite de Provence, Faculté des Sciences et Techniques de St Jérôme, Marseille Cedex 20, France
    Appl Opt 47:C279-83. 2008
    ..Numerical calculation is performed to validate the principles of a single optical technique devoted to real time probing or imaging of submultilayers within interferential coatings...
  2. ncbi request reprint Z-probing of optical multilayers: theory
    Claude Amra
    Institut Fresnel Marseille, UMR CNRSTIC, Universite Paul Cezanne, Ecole Génealiste Ingénieurs Marseille, Cedex, France
    Opt Lett 31:2704-6. 2006
    ..A single optical technique is presented that allows direct and selective probing or imaging in the thickness of multilayers. It is based on tunable interferences of polarized light. Adequate vertical resolution is provided with this method...
  3. ncbi request reprint Partial polarization of light induced by random defects at surfaces or bulks
    Claude Amra
    Institut Fresnel, UMR CNRS 6133, Aix Marseille Universités, Ecole Centrale MarseilleFaculté des Sciences et Techniques de St Jérôme, 13397 Marseille Cedex 20, France
    Opt Express 16:10372-83. 2008
    ..These effects are theoretically predicted and confirmed via multiscale polarization measurements in the speckle pattern of rough surfaces. "Full" polarization can be recovered when reducing the receiver aperture...
  4. ncbi request reprint From angle-resolved ellipsometry of light scattering to imaging in random media
    Gaelle Georges
    Institut Fresnel, Unite Mixte de Recherche, Centre National de la Recherche Scientifique ST2I 6133, Universite Paul Cezanne, Universite de Provence, Faculté des Sciences et Techniques de St Jérôme, Marseille Cedex 20, France
    Appl Opt 47:C257-65. 2008
    ..Experiments and a procedure for selective imaging in random media are described...
  5. ncbi request reprint Optical characterization of an unknown single layer: Institut Fresnel contribution to the Optical Interference Coatings 2004 Topical Meeting Measurement Problem
    Fabien Lemarchand
    Institut Fresnel UMR CNRS 6133, Universite Paul Cezanne, Domaine Universitaire de Saint Jerome, 13397 Marseille Cedex 20, France
    Appl Opt 45:1312-8. 2006
    ..Topography measurements include atomic force microscopy and angle-resolved scattering measurements. These results are completed thanks to a Taylor Hobson noncontact 3D surface profiler...
  6. ncbi request reprint Piezoelectric tantalum pentoxide studied for optical tunable applications
    Rémy Parmentier
    Institut Fresnel, Unite Mixte de Recherche, Centre National de la Recherche Scientifique 6133, Ecole Nationale Supérieure de Physique de Marseille, Domaine Universitaire de Saint Jérĵme, France
    Appl Opt 41:3270-6. 2002
    ..Then the resultant thickness variation under oscillating applied voltage is measured with an extrinsic Fabry-Perot interferometer setup...
  7. ncbi request reprint Ellipsometry of reflected and scattered fields for the analysis of substrate optical quality
    Carole Deumié
    Institut Fresnel, Ecole Généraliste d Ingénieurs de Marseille, Universite Paul Cezanne Aix Marseille III, Université de Provence Aix Marseille I, Domaine universitaire de St Jerome, France
    Appl Opt 45:1640-9. 2006
    ..Experimental results are presented concerning transition layers for damage threshold applications and for rough surfaces or bulks...
  8. ncbi request reprint Light-scattering characterization of transparent substrates
    Myriam Zerrad
    Institut Fresnel, Unité Mixte de Recherche CNRSTIC 6133, Ecole Généraliste d Ingénieurs de Marseille, Université Paul Cézanne Aix Marseille I, Domaine universitaire de St Jerome, 13397 Marseille Cedex 20, France
    Appl Opt 45:1402-9. 2006
    ..We show how to overcome this issue and apply these principles to the characterization of superpolished samples...
  9. ncbi request reprint Toward tunable thin-film filters for wavelength division multiplexing applications
    Michel Lequime
    Institut Fresnel, Unite Mixte de Recherche 6133, Centre National de la Recherche Scientifique, Ecole Nationale Supérieure de Physique de Marseille, Domaine Universitaire de Saint Jérĵme, France
    Appl Opt 41:3277-84. 2002
    ..We describe and compare practical arrangements using either temperature or an electric field as the driving parameter...
  10. ncbi request reprint Statistical signatures of random media and their correlation to polarization properties
    Jacques Sorrentini
    Institut Fresnel CNRS, Universités d Aix Marseille, Ecole Centrale Marseille, Domaine Universitaire de Saint Jerome, 13397 Marseille Cedex 20, France
    Opt Lett 34:2429-31. 2009
    ..The speckle statistics are shown to be correlated to partial polarization. Angle-resolved ellipsometric data confirm all conclusions...
  11. doi request reprint Spectral effectiveness of engineered thermal cloaks in the frequency regime
    David Petiteau
    Aix Marseille Universite, CNRS, Centrale Marseille, Institut Fresnel, UMR 7249, 13013 Marseille, France
    Sci Rep 4:7386. 2014
    ..However, approximate cloaking with multi-layered cloak critically depends upon the homogenization algorithm and it is shown that the standard deviation varies linearly with the inverse of the number of layers. ..
  12. doi request reprint Transformation thermodynamics: cloaking and concentrating heat flux
    Sebastien Guenneau
    Institut Fresnel, UMR CNRS 6133, Aix Marseille Universite, Campus universitaire de Saint Jérôme, Marseille 13013, France
    Opt Express 20:8207-18. 2012
    ..We finally propose a multilayered cloak consisting of 20 homogeneous concentric layers with a piecewise constant isotropic diffusivity working over a finite time interval (homogenization approach)...
  13. doi request reprint Gradual loss of polarization in light scattered from rough surfaces: electromagnetic prediction
    Myriam Zerrad
    Institut Fresnel, UMR CNRS6133 Aix Marseille Universités, Ecole Centrale Marseille, Faculte des Sciences et Techniques de Saint Jerome, 13397 Marseille Cedex 20, France
    Opt Express 18:15832-43. 2010
    ..The receiver aperture is taken into account by means of a multiscale spatial averaging process. The polarization degrees are connected with the structural parameters of surfaces...
  14. doi request reprint Optical component interface scatter characterization by selective polarization extinction
    Gaelle Georges
    Institut Fresnel, CNRS, Aix Marseille Universite, Ecole Centrale Marseille, Marseille, France
    Appl Opt 50:C349-56. 2011
    ..Experimental data collected using the technique are compared with measurements made using a white-light optical surface profilometry...
  15. ncbi request reprint Overcoated microspheres for specific optical powders
    Carole Deumié
    Institut Fresnel, Unite Mixte de Recherche 6133, Ecole Nationale Supérieure de Physique de Marseille, Domaine Universitaire de St Jérĵme, France
    Appl Opt 41:3299-305. 2002
    ..Electron-beam deposition is used with a particular vibration system. Calibration and characterization results are presented that validate the techniques and procedures for single-layers and quarter-wave mirrors...
  16. ncbi request reprint Angle-resolved ellipsometry of light scattering: discrimination of surface and bulk effects in substrates and optical coatings
    Carole Deumié
    Institut Fresnel, Unite Mixte de Recherche, Centre National de la Recherche Scientifique 6133, Ecole Nationale Supérieure de Physique de Marseille, Domaine universitaire de St Jerome, France
    Appl Opt 41:3362-9. 2002
    ..Surface and bulk effects can be separated in most situations, as well as the oblique growth of materials and the presence of first-order contaminants...
  17. doi request reprint Anisotropic conductivity rotates heat fluxes in transient regimes
    Sebastien Guenneau
    Institut Fresnel, UMR CNRS 7249, Aix Marseille Universite, Campus universitaire de Saint Jérôme, Marseille 13013, France
    Opt Express 21:6578-83. 2013
    ..A structured rotator is finally proposed inspired by earlier designs of thermostatic and microwave rotators...
  18. ncbi request reprint Coherence and polarization properties in speckle of totally depolarized light scattered by totally depolarizing media
    Philippe Refregier
    Institut Fresnel, CNRS, Aix Marseille Universite, Ecole Centrale Marseille, Campus de Saint Jérôme, 13013 Marseille, France
    Opt Lett 37:2055-7. 2012
    ..We analyze the behavior of some polarization and coherence properties in such a physical situation...
  19. doi request reprint Optimal design for 100% absorption and maximum field enhancement in thin-film multilayers at resonances under total reflection
    Cesaire Ndiaye
    Institut Fresnel, UMR CNRS 6133 Universités d Aix Marseille, Ecole Centrale Marseille, Marseille, France
    Appl Opt 50:C382-7. 2011
    ..The corresponding field enhancement within the stack can be arbitrarily increased with the optimization procedure. Applications concern optical sensors and threshold lasers...