Sikun Li

Summary

Country: China

Publications

  1. ncbi request reprint Reliability-guided phase unwrapping in wavelet-transform profilometry
    Sikun Li
    School of Electronic and Information Engineering, Key Laboratory of Fundamental Science for National Defense, Sichuan University, Chengdu, China
    Appl Opt 47:3369-77. 2008
  2. ncbi request reprint Eliminating the zero spectrum in Fourier transform profilometry using empirical mode decomposition
    Sikun Li
    Department of Opto Electronics, Sichuan University, Chengdu 610064, China
    J Opt Soc Am A Opt Image Sci Vis 26:1195-201. 2009
  3. doi request reprint Spatial carrier fringe pattern phase demodulation by use of a two-dimensional real wavelet
    Sikun Li
    Department of Opto Electronic, Sichuan University, Chengdu 610064, China
    Appl Opt 48:6893-906. 2009

Detail Information

Publications3

  1. ncbi request reprint Reliability-guided phase unwrapping in wavelet-transform profilometry
    Sikun Li
    School of Electronic and Information Engineering, Key Laboratory of Fundamental Science for National Defense, Sichuan University, Chengdu, China
    Appl Opt 47:3369-77. 2008
    ..Computer simulations and experiments verify our theory...
  2. ncbi request reprint Eliminating the zero spectrum in Fourier transform profilometry using empirical mode decomposition
    Sikun Li
    Department of Opto Electronics, Sichuan University, Chengdu 610064, China
    J Opt Soc Am A Opt Image Sci Vis 26:1195-201. 2009
    ..Then the zero spectrum is separated from the high-frequency components effectively. Experiments validate the feasibility of this method...
  3. doi request reprint Spatial carrier fringe pattern phase demodulation by use of a two-dimensional real wavelet
    Sikun Li
    Department of Opto Electronic, Sichuan University, Chengdu 610064, China
    Appl Opt 48:6893-906. 2009
    ..Computer simulations and experiments verified the validity of the proposed method...