Raymond F Egerton

Summary

Affiliation: University of Alberta
Country: Canada

Publications

  1. ncbi Improved background-fitting algorithms for ionization edges in electron energy-loss spectra
    R F Egerton
    Physics Department, Faculty of Science, University of Alberta, Edmonton, Canada
    Ultramicroscopy 92:47-56. 2002
  2. ncbi Improving the energy resolution of X-ray and electron energy-loss spectra
    R F Egerton
    Physics Department, University of Alberta, Edmonton, Alta, Canada T6G 2J1
    Micron 37:310-5. 2006
  3. ncbi New techniques in electron energy-loss spectroscopy and energy-filtered imaging
    R F Egerton
    Faculty of Science, University of Alberta, Edmonton, Alta T6G 2J1, Canada
    Micron 34:127-39. 2003
  4. ncbi Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy
    R F Egerton
    Department of Physics, Room 238 CEB, 11322 89 Avenue, University of Alberta, Edmonton, Alberta, Canada
    Ultramicroscopy 107:575-86. 2007
  5. doi Vibrational-loss EELS and the avoidance of radiation damage
    R F Egerton
    Physics Department, University of Alberta, Edmonton, Canada T6G 2E1 Electronic address
    Ultramicroscopy 159:95-100. 2015
  6. doi Choice of operating voltage for a transmission electron microscope
    R F Egerton
    Physics Department, University of Alberta, Edmonton, Canada T6G 2E1 Electronic address
    Ultramicroscopy 145:85-93. 2014
  7. doi Beam-induced motion of adatoms in the transmission electron microscope
    R F Egerton
    Physics Department, University of Alberta, Edmonton T6G 2E1, Canada
    Microsc Microanal 19:479-86. 2013
  8. doi Control of radiation damage in the TEM
    R F Egerton
    Physics Department, University of Alberta, Edmonton, Canada T6G 2G7
    Ultramicroscopy 127:100-8. 2013
  9. doi Mechanisms of radiation damage in beam-sensitive specimens, for TEM accelerating voltages between 10 and 300 kV
    R F Egerton
    Physics Department, University of Alberta, Edmonton, Canada
    Microsc Res Tech 75:1550-6. 2012
  10. doi TEM-EELS: a personal perspective
    R F Egerton
    Physics Department, University of Alberta, Edmonton, Canada T6G 2E1
    Ultramicroscopy 119:24-32. 2012

Collaborators

Detail Information

Publications13

  1. ncbi Improved background-fitting algorithms for ionization edges in electron energy-loss spectra
    R F Egerton
    Physics Department, Faculty of Science, University of Alberta, Edmonton, Canada
    Ultramicroscopy 92:47-56. 2002
    ..The algorithms are currently implemented as short Calculator programs for Gatan EL/P software. Their advantages and limitations are discussed, in comparison with multiple-least-squares and spatial-difference techniques...
  2. ncbi Improving the energy resolution of X-ray and electron energy-loss spectra
    R F Egerton
    Physics Department, University of Alberta, Edmonton, Alta, Canada T6G 2J1
    Micron 37:310-5. 2006
    ..Even so, care should be exercised in interpreting low intensity at low energy loss (after sharpening) as evidence for a bandgap in the electronic density of states...
  3. ncbi New techniques in electron energy-loss spectroscopy and energy-filtered imaging
    R F Egerton
    Faculty of Science, University of Alberta, Edmonton, Alta T6G 2J1, Canada
    Micron 34:127-39. 2003
    ....
  4. ncbi Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy
    R F Egerton
    Department of Physics, Room 238 CEB, 11322 89 Avenue, University of Alberta, Edmonton, Alberta, Canada
    Ultramicroscopy 107:575-86. 2007
    ..To aid the experimentalist, analytical expressions are given for beam broadening, delocalization length, energy broadening due to core-hole and excited-electron lifetimes, and for the momentum resolution in angle-resolved EELS...
  5. doi Vibrational-loss EELS and the avoidance of radiation damage
    R F Egerton
    Physics Department, University of Alberta, Edmonton, Canada T6G 2E1 Electronic address
    Ultramicroscopy 159:95-100. 2015
    ....
  6. doi Choice of operating voltage for a transmission electron microscope
    R F Egerton
    Physics Department, University of Alberta, Edmonton, Canada T6G 2E1 Electronic address
    Ultramicroscopy 145:85-93. 2014
    ..Use of a phase plate in a conventional TEM offers the most dose-efficient way of achieving atomic resolution from beam-sensitive specimens. ..
  7. doi Beam-induced motion of adatoms in the transmission electron microscope
    R F Egerton
    Physics Department, University of Alberta, Edmonton T6G 2E1, Canada
    Microsc Microanal 19:479-86. 2013
    ..The rate of beam-induced adatom motion is predicted to exceed that of room-temperature thermal motion when the surface-diffusion energy is greater than about 0.5 eV...
  8. doi Control of radiation damage in the TEM
    R F Egerton
    Physics Department, University of Alberta, Edmonton, Canada T6G 2G7
    Ultramicroscopy 127:100-8. 2013
    ..Further experiments are suggested as a means of obtaining a better understanding and control of electron-beam damage...
  9. doi Mechanisms of radiation damage in beam-sensitive specimens, for TEM accelerating voltages between 10 and 300 kV
    R F Egerton
    Physics Department, University of Alberta, Edmonton, Canada
    Microsc Res Tech 75:1550-6. 2012
    ..Ways of experimentally determining the damage mechanism (with a view to minimizing damage) are discussed...
  10. doi TEM-EELS: a personal perspective
    R F Egerton
    Physics Department, University of Alberta, Edmonton, Canada T6G 2E1
    Ultramicroscopy 119:24-32. 2012
    ..The current state of the art is reviewed, together with some challenges for the future...
  11. ncbi Beam-induced damage to thin specimens in an intense electron probe
    Raymond F Egerton
    Physics Department, University of Alberta, Edmonton, AB T6G 2J1, Canada
    Microsc Microanal 12:65-71. 2006
    ..The results are discussed in terms of mechanisms, including electron-beam sputtering and surface diffusion. Strategies for minimizing the effect of the beam are considered...
  12. ncbi Radiation damage in the TEM and SEM
    R F Egerton
    Department of Physics, University of Alberta, Faculty of Science, 412 Avadh Bhatia Phy, Edmonton T6G 2J1, Canada
    Micron 35:399-409. 2004
    ....
  13. doi Delocalized radiation damage in polymers
    R F Egerton
    Department of Physics, University of Alberta, Edmonton, Canada
    Micron 43:2-7. 2012
    ....