Research Topics

Changqing Xie

Summary

Publications

  1. doi Feasibility study of hard-x-ray nanofocusing above 20 keV using compound photon sieves
    Changqing Xie
    Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
    Opt Lett 35:4048-50. 2010
  2. doi Toward two-dimensional nanometer resolution hard X-ray differential-interference-contrast imaging using modified photon sieves
    Changqing Xie
    Key Laboratory of Laboratory of Nano Fabrication and Novel Devices Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China
    Opt Lett 37:749-51. 2012

Detail Information

Publications2

  1. doi Feasibility study of hard-x-ray nanofocusing above 20 keV using compound photon sieves
    Changqing Xie
    Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
    Opt Lett 35:4048-50. 2010
    ..Further improvement of the high-aspect-ratio metal nanostructure process will allow CPSs to be a promising candidate for hard-x-ray nanofocusing in the high-energy region above 20 keV...
  2. doi Toward two-dimensional nanometer resolution hard X-ray differential-interference-contrast imaging using modified photon sieves
    Changqing Xie
    Key Laboratory of Laboratory of Nano Fabrication and Novel Devices Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China
    Opt Lett 37:749-51. 2012
    ..We anticipate that MPSs can provide a complementary and versatile high-resolution nondestructive imaging tool for ultra-large-scale integrated circuits at 45 nm node and below...