- Scattered light fluorescence microscopy: imaging through turbid layersIvo M Vellekoop
Physik Institut, Universitat Zurich, Winterthurerstrasse 190, CH 8057 Zurich, Switzerland
Opt Lett 35:1245-7. 2010..Our method uses constructive interference to focus scattered laser light through the turbid layer. Microscopic fluorescent structures behind the layer were imaged by raster scanning the focus...