Jian min Zuo

Summary

Affiliation: University of Illinois
Country: USA

Publications

  1. doi request reprint Combining real and reciprocal space information for aberration free coherent electron diffractive imaging
    Jian min Zuo
    Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Ultramicroscopy 111:817-23. 2011
  2. pmc High-index facets in gold nanocrystals elucidated by coherent electron diffraction
    Amish B Shah
    Center for Microanalysis of Materials, Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, Illinois 61801, United States
    Nano Lett 13:1840-6. 2013
  3. ncbi request reprint One-dimensional self-assembly of metallic nanostructures on single-walled carbon-nanotube bundles
    Weijie Huang
    Department of Materials Science and Engineering and Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Small 2:1418-21. 2006
  4. doi request reprint Lattice and strain analysis of atomic resolution Z-contrast images based on template matching
    Jian min Zuo
    Department of Materials Science and Engineering, University of Illinois, Urbana, IL 61801, USA Seitz Materials Research Laboratory, University of Illinois, Urbana, IL 61801, USA Electronic address
    Ultramicroscopy 136:50-60. 2014
  5. doi request reprint Symmetry quantification and mapping using convergent beam electron diffraction
    Kyou Hyun Kim
    Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Ultramicroscopy 124:71-6. 2013
  6. ncbi request reprint The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the university of illinois
    Jianguo Wen
    Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Microsc Microanal 16:183-93. 2010

Collaborators

  • Hao Chen
  • Catherine J Murphy
  • Amish B Shah
  • Jianguo Wen
  • Kyou Hyun Kim
  • Weijie Huang
  • Brent M Devetter
  • Timothy K Yang
  • Rohit Bhargava
  • Sean T Sivapalan
  • Toshihiro Aoki
  • Changhui Lei
  • Varistha Chobpattana
  • Ivan Petrov
  • Satoshi Mishina
  • Jiong Zhang
  • James Mabon
  • Ernie Sammann
  • Ke Ran
  • Steve Burdin

Detail Information

Publications6

  1. doi request reprint Combining real and reciprocal space information for aberration free coherent electron diffractive imaging
    Jian min Zuo
    Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Ultramicroscopy 111:817-23. 2011
    ..We demonstrate these techniques by reconstructing the complex wave function of quantum dots and carbon nanotubes beyond the microscope's resolution limit...
  2. pmc High-index facets in gold nanocrystals elucidated by coherent electron diffraction
    Amish B Shah
    Center for Microanalysis of Materials, Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, Illinois 61801, United States
    Nano Lett 13:1840-6. 2013
    ..We report new high-index facets in trisoctahedra and previous unappreciated diversity in facet sharpness...
  3. ncbi request reprint One-dimensional self-assembly of metallic nanostructures on single-walled carbon-nanotube bundles
    Weijie Huang
    Department of Materials Science and Engineering and Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Small 2:1418-21. 2006
  4. doi request reprint Lattice and strain analysis of atomic resolution Z-contrast images based on template matching
    Jian min Zuo
    Department of Materials Science and Engineering, University of Illinois, Urbana, IL 61801, USA Seitz Materials Research Laboratory, University of Illinois, Urbana, IL 61801, USA Electronic address
    Ultramicroscopy 136:50-60. 2014
    ..Our methods are general, model free and provide high spatial resolution for lattice analysis...
  5. doi request reprint Symmetry quantification and mapping using convergent beam electron diffraction
    Kyou Hyun Kim
    Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Ultramicroscopy 124:71-6. 2013
    ..Using the mirror symmetry as an example, we demonstrate that the normalized cross-correlation coefficient provides an effective and robust measurement of the symmetry recorded in experimental CBED patterns...
  6. ncbi request reprint The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the university of illinois
    Jianguo Wen
    Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Microsc Microanal 16:183-93. 2010
    ..The different probes that can be formed using the probe corrected STEM opens up new applications for electron microscopy and diffraction...