Jian min Zuo

Summary

Affiliation: University of Illinois
Country: USA

Publications

  1. doi request reprint Combining real and reciprocal space information for aberration free coherent electron diffractive imaging
    Jian min Zuo
    Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Ultramicroscopy 111:817-23. 2011
  2. pmc High-index facets in gold nanocrystals elucidated by coherent electron diffraction
    Amish B Shah
    Center for Microanalysis of Materials, Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, Illinois 61801, United States
    Nano Lett 13:1840-6. 2013
  3. doi request reprint Direct Observation of Interfacial Au Atoms on TiO2 in Three Dimensions
    Wenpei Gao
    Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, 1304 West Green Street, Urbana, Illinois 61801, United States
    Nano Lett 15:2548-54. 2015
  4. doi request reprint Growth of Au on Pt Icosahedral Nanoparticles Revealed by Low-Dose In Situ TEM
    Jianbo Wu
    Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, 1304 West Green Street, Urbana, Illinois 61801, United States
    Nano Lett 15:2711-5. 2015
  5. doi request reprint Large area and depth-profiling dislocation imaging and strain analysis in Si/SiGe/Si heterostructures
    Xin Chen
    1Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Microsc Microanal 20:1521-7. 2014
  6. ncbi request reprint One-dimensional self-assembly of metallic nanostructures on single-walled carbon-nanotube bundles
    Weijie Huang
    Department of Materials Science and Engineering and Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Small 2:1418-21. 2006
  7. doi request reprint Atomic resolution tomography reconstruction of tilt series based on a GPU accelerated hybrid input-output algorithm using polar Fourier transform
    Xiangwen Lu
    College of Computer Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, 1304 W Green St, Urbana, IL 61801, USA
    Ultramicroscopy 149:64-73. 2015
  8. doi request reprint TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis
    Kyou Hyun Kim
    Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Micron 71:39-45. 2015
  9. doi request reprint Lattice and strain analysis of atomic resolution Z-contrast images based on template matching
    Jian min Zuo
    Department of Materials Science and Engineering, University of Illinois, Urbana, IL 61801, USA Seitz Materials Research Laboratory, University of Illinois, Urbana, IL 61801, USA Electronic address
    Ultramicroscopy 136:50-60. 2014
  10. doi request reprint Symmetry quantification and mapping using convergent beam electron diffraction
    Kyou Hyun Kim
    Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Ultramicroscopy 124:71-6. 2013

Collaborators

  • Xin Chen
  • Hao Chen
  • Catherine J Murphy
  • Haifeng Wang
  • Jianguo Wen
  • Wenpei Gao
  • Kyou Hyun Kim
  • Amish B Shah
  • Xiangwen Lu
  • Jianbo Wu
  • Weijie Huang
  • Hui Xing
  • Dean J Miller
  • Jiabin Yuan
  • Hong Yang
  • Peng Zhang
  • Ping Lu
  • Shankar Sivaramakrishnan
  • Sean T Sivapalan
  • Timothy K Yang
  • Brent M Devetter
  • Rohit Bhargava
  • Changhui Lei
  • Ke Ran
  • James Mabon
  • Satoshi Mishina
  • Toshihiro Aoki
  • Ernie Sammann
  • Jiong Zhang
  • Steve Burdin
  • Ivan Petrov
  • Varistha Chobpattana

Detail Information

Publications11

  1. doi request reprint Combining real and reciprocal space information for aberration free coherent electron diffractive imaging
    Jian min Zuo
    Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Ultramicroscopy 111:817-23. 2011
    ..We demonstrate these techniques by reconstructing the complex wave function of quantum dots and carbon nanotubes beyond the microscope's resolution limit...
  2. pmc High-index facets in gold nanocrystals elucidated by coherent electron diffraction
    Amish B Shah
    Center for Microanalysis of Materials, Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, Illinois 61801, United States
    Nano Lett 13:1840-6. 2013
    ..We report new high-index facets in trisoctahedra and previous unappreciated diversity in facet sharpness...
  3. doi request reprint Direct Observation of Interfacial Au Atoms on TiO2 in Three Dimensions
    Wenpei Gao
    Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, 1304 West Green Street, Urbana, Illinois 61801, United States
    Nano Lett 15:2548-54. 2015
    ..Direct impact of interfacial Au atoms is observed on an enhanced Au-TiO2 interaction and the reduction of surface TiO2; both are critical to Au catalysis. ..
  4. doi request reprint Growth of Au on Pt Icosahedral Nanoparticles Revealed by Low-Dose In Situ TEM
    Jianbo Wu
    Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, 1304 West Green Street, Urbana, Illinois 61801, United States
    Nano Lett 15:2711-5. 2015
    ..We demonstrated that in situ electron microscopy is a valuable tool for quantitative study of nucleation and growth kinetics and can provide new insight into the design and precise control of heterogeneous nanostructures. ..
  5. doi request reprint Large area and depth-profiling dislocation imaging and strain analysis in Si/SiGe/Si heterostructures
    Xin Chen
    1Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Microsc Microanal 20:1521-7. 2014
    ..High-resolution scanning transmission electron microscopy cross-section analysis clearly shows the individual composition layers and the dislocation lines in the layers, which supports the EBIC and XRD RSM results. ..
  6. ncbi request reprint One-dimensional self-assembly of metallic nanostructures on single-walled carbon-nanotube bundles
    Weijie Huang
    Department of Materials Science and Engineering and Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Small 2:1418-21. 2006
  7. doi request reprint Atomic resolution tomography reconstruction of tilt series based on a GPU accelerated hybrid input-output algorithm using polar Fourier transform
    Xiangwen Lu
    College of Computer Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, 1304 W Green St, Urbana, IL 61801, USA
    Ultramicroscopy 149:64-73. 2015
    ..The capability demonstrated here provides an opportunity to uncover the 3D structure of small objects of nanometers in size by electron diffraction. ..
  8. doi request reprint TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis
    Kyou Hyun Kim
    Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Micron 71:39-45. 2015
    ..We demonstrate that our method provides an effective and robust way for recording diffraction patterns from nanometer-sized grains...
  9. doi request reprint Lattice and strain analysis of atomic resolution Z-contrast images based on template matching
    Jian min Zuo
    Department of Materials Science and Engineering, University of Illinois, Urbana, IL 61801, USA Seitz Materials Research Laboratory, University of Illinois, Urbana, IL 61801, USA Electronic address
    Ultramicroscopy 136:50-60. 2014
    ..Our methods are general, model free and provide high spatial resolution for lattice analysis...
  10. doi request reprint Symmetry quantification and mapping using convergent beam electron diffraction
    Kyou Hyun Kim
    Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Ultramicroscopy 124:71-6. 2013
    ..Using the mirror symmetry as an example, we demonstrate that the normalized cross-correlation coefficient provides an effective and robust measurement of the symmetry recorded in experimental CBED patterns...
  11. ncbi request reprint The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the university of illinois
    Jianguo Wen
    Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Microsc Microanal 16:183-93. 2010
    ..The different probes that can be formed using the probe corrected STEM opens up new applications for electron microscopy and diffraction...