Jian min Zuo

Summary

Affiliation: University of Illinois
Country: USA

Publications

  1. doi request reprint Combining real and reciprocal space information for aberration free coherent electron diffractive imaging
    Jian min Zuo
    Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Ultramicroscopy 111:817-23. 2011
  2. pmc High-index facets in gold nanocrystals elucidated by coherent electron diffraction
    Amish B Shah
    Center for Microanalysis of Materials, Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, Illinois 61801, United States
    Nano Lett 13:1840-6. 2013
  3. doi request reprint Symmetry quantification and mapping using convergent beam electron diffraction
    Kyou Hyun Kim
    Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Ultramicroscopy 124:71-6. 2013
  4. ncbi request reprint The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the university of illinois
    Jianguo Wen
    Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Microsc Microanal 16:183-93. 2010

Collaborators

  • Amish B Shah
  • Jianguo Wen
  • Kyou Hyun Kim
  • Sean T Sivapalan
  • Rohit Bhargava
  • Brent M Devetter
  • Timothy K Yang
  • Catherine J Murphy
  • Steve Burdin
  • Ivan Petrov
  • Toshihiro Aoki
  • Changhui Lei
  • Satoshi Mishina
  • Ernie Sammann
  • Varistha Chobpattana
  • James Mabon
  • Ke Ran
  • Jiong Zhang

Detail Information

Publications4

  1. doi request reprint Combining real and reciprocal space information for aberration free coherent electron diffractive imaging
    Jian min Zuo
    Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Ultramicroscopy 111:817-23. 2011
    ..We demonstrate these techniques by reconstructing the complex wave function of quantum dots and carbon nanotubes beyond the microscope's resolution limit...
  2. pmc High-index facets in gold nanocrystals elucidated by coherent electron diffraction
    Amish B Shah
    Center for Microanalysis of Materials, Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, Illinois 61801, United States
    Nano Lett 13:1840-6. 2013
    ..We report new high-index facets in trisoctahedra and previous unappreciated diversity in facet sharpness...
  3. doi request reprint Symmetry quantification and mapping using convergent beam electron diffraction
    Kyou Hyun Kim
    Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Ultramicroscopy 124:71-6. 2013
    ..Using the mirror symmetry as an example, we demonstrate that the normalized cross-correlation coefficient provides an effective and robust measurement of the symmetry recorded in experimental CBED patterns...
  4. ncbi request reprint The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the university of illinois
    Jianguo Wen
    Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL 61801, USA
    Microsc Microanal 16:183-93. 2010
    ..The different probes that can be formed using the probe corrected STEM opens up new applications for electron microscopy and diffraction...