Matthew D McMahon

Summary

Affiliation: National Institute of Standards and Technology
Country: USA

Publications

  1. ncbi 3D particle trajectories observed by orthogonal tracking microscopy
    Matthew D McMahon
    Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
    ACS Nano 3:609-14. 2009
  2. ncbi Fast, bias-free algorithm for tracking single particles with variable size and shape
    Andrew J Berglund
    Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
    Opt Express 16:14064-75. 2008
  3. ncbi Theoretical model of errors in micromirror-based three-dimensional particle tracking
    Andrew J Berglund
    Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
    Opt Lett 35:1905-7. 2010

Collaborators

Detail Information

Publications3

  1. ncbi 3D particle trajectories observed by orthogonal tracking microscopy
    Matthew D McMahon
    Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
    ACS Nano 3:609-14. 2009
    ..Because the image processing requires only approximately 1 ms per frame, this technique could enable real-time feedback-controlled nanoparticle assembly applications with nanometer precision...
  2. ncbi Fast, bias-free algorithm for tracking single particles with variable size and shape
    Andrew J Berglund
    Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
    Opt Express 16:14064-75. 2008
    ..We demonstrate it both numerically and experimentally, using an inexpensive CCD camera to localize 190 nm fluorescent microspheres to better than 5 nm...
  3. ncbi Theoretical model of errors in micromirror-based three-dimensional particle tracking
    Andrew J Berglund
    Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
    Opt Lett 35:1905-7. 2010
    ..In particle-tracking applications, asymmetric image degradation manifests itself as systematic tracking errors. Based on our results, we identify strategies for reducing systematic errors to the 10nm level in practical applications...