David Ruppert

Summary

Affiliation: Cornell University
Country: USA

Publications

  1. ncbi request reprint Exploring the information in p-values for the analysis and planning of multiple-test experiments
    David Ruppert
    School of Operations Research and Industrial Engineering, Cornell University, Rhodes Hall, Ithaca, NY 14853, USA
    Biometrics 63:483-95. 2007
  2. ncbi request reprint Assessing the skill of yes/no predictions
    William Briggs
    Division of General Internal Medicine, Weill Cornell Medical College, 525 E 68th Street, Box 46, New York, New York 10021, USA
    Biometrics 61:799-807. 2005
  3. pmc Aberrant crypt foci and semiparametric modeling of correlated binary data
    Tatiyana V Apanasovich
    School of Operations Research and Industrial Engineering, Cornell University, Ithaca, New York 14853, USA
    Biometrics 64:490-500. 2008

Collaborators

Detail Information

Publications3

  1. ncbi request reprint Exploring the information in p-values for the analysis and planning of multiple-test experiments
    David Ruppert
    School of Operations Research and Industrial Engineering, Cornell University, Rhodes Hall, Ithaca, NY 14853, USA
    Biometrics 63:483-95. 2007
    ..The most biased of our estimators is very similar in performance to the convex, decreasing estimator. As an illustration, we analyze differences in gene expression between resistant and susceptible strains of barley...
  2. ncbi request reprint Assessing the skill of yes/no predictions
    William Briggs
    Division of General Internal Medicine, Weill Cornell Medical College, 525 E 68th Street, Box 46, New York, New York 10021, USA
    Biometrics 61:799-807. 2005
    ..Predictions that pass this test are said to have skill. Only skillful predictions should be used. Graphical and numerical methods to identify skill will be demonstrated. The usefulness of mammograms is explored...
  3. pmc Aberrant crypt foci and semiparametric modeling of correlated binary data
    Tatiyana V Apanasovich
    School of Operations Research and Industrial Engineering, Cornell University, Ithaca, New York 14853, USA
    Biometrics 64:490-500. 2008
    ..Finally, we apply the methods to the data from our experiment ACF. We discover an unexpected location for peak formation of ACF...