M Beleggia

Summary

Affiliation: Brookhaven National Laboratory
Country: USA

Publications

  1. ncbi A Fourier approach to fields and electron optical phase-shifts calculations
    M Beleggia
    Materials Science Department, Brookhaven National Laboratory, Upton, NY 11973, USA
    Ultramicroscopy 96:93-103. 2003
  2. ncbi On the transport of intensity technique for phase retrieval
    M Beleggia
    Brookhaven National Laboratory, Center for Functional Nanomaterials, Building 480, Upton, NY 11973, USA
    Ultramicroscopy 102:37-49. 2004
  3. ncbi Characterization of JEOL 2100F Lorentz-TEM for low-magnification electron holography and magnetic imaging
    M A Schofield
    Brookhaven National Laboratory, Condensed Matter, Physics and Materials Science Department, Building 480, Upton, NY 11973, USA
    Ultramicroscopy 108:625-34. 2008

Collaborators

Detail Information

Publications3

  1. ncbi A Fourier approach to fields and electron optical phase-shifts calculations
    M Beleggia
    Materials Science Department, Brookhaven National Laboratory, Upton, NY 11973, USA
    Ultramicroscopy 96:93-103. 2003
    ..It is shown that this approach not only allows to take into account rather easily the effect of the fringing fields protruding in the space around the specimen, but also to obtain solutions to interesting models in analytical form...
  2. ncbi On the transport of intensity technique for phase retrieval
    M Beleggia
    Brookhaven National Laboratory, Center for Functional Nanomaterials, Building 480, Upton, NY 11973, USA
    Ultramicroscopy 102:37-49. 2004
    ..Another example is given, the reconstruction of a phase jump, accompanied with experimental support showing that phase retrieval by Electron Holography and Transport of Intensity techniques yields results in good agreement...
  3. ncbi Characterization of JEOL 2100F Lorentz-TEM for low-magnification electron holography and magnetic imaging
    M A Schofield
    Brookhaven National Laboratory, Condensed Matter, Physics and Materials Science Department, Building 480, Upton, NY 11973, USA
    Ultramicroscopy 108:625-34. 2008
    ..These results indicate the usefulness of measuring these optical parameters to guide the optimization of the experimental setup for a given microscope, and to provide an additional degree of practical experimental possibility...