Ampere A Tseng

Summary

Affiliation: Arizona State University
Country: USA

Publications

  1. pmc Nanopatterning on silicon surface using atomic force microscopy with diamond-like carbon (DLC)-coated Si probe
    Xiaohong Jiang
    Key Laboratory of Special Functional Materials of Ministry of Education, Henan University, Kaifeng 475004, People s Republic of China
    Nanoscale Res Lett 6:518. 2011
  2. ncbi Recent developments in nanofabrication using focused ion beams
    Ampere A Tseng
    Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, Arizona 85287 6106, USA
    Small 1:924-39. 2005
  3. ncbi Recent developments in nanofabrication using ion projection lithography
    Ampere A Tseng
    Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, AZ 85287 6106, USA
    Small 1:594-608. 2005
  4. doi Removing material using atomic force microscopy with single- and multiple-tip sources
    Ampere A Tseng
    School for Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, Arizona 85287 6106, USA
    Small 7:3409-27. 2011
  5. ncbi Manipulations of atoms and molecules by scanning probe microscopy
    Ampere A Tseng
    Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, Arizona 85287 6106, USA
    J Nanosci Nanotechnol 7:2582-95. 2007
  6. ncbi Nanoscale fabrication by nonconventional approaches
    Ampere A Tseng
    Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, Arizona 85287 6106, USA
    J Nanosci Nanotechnol 5:683-702. 2005
  7. ncbi Nanomachining of permalloy for fabricating nanoscale ferromagnetic structures using atomic force microscopy
    Ampere A Tseng
    Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, Arizona 85287 6106, USA
    J Nanosci Nanotechnol 10:456-66. 2010
  8. ncbi Profile uniformity of overlapped oxide dots induced by atomic force microscopy
    Ampere A Tseng
    Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, Arizona 85287 6106, USA
    J Nanosci Nanotechnol 10:4390-9. 2010
  9. ncbi Energy shifts of Si oxidation states in the system of Si nanocrystals embedded in SiO2 matrix
    T P Chen
    School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore
    J Nanosci Nanotechnol 7:2506-10. 2007

Collaborators

  • Zhuang Li
  • Yu Liu
  • Xiaohong Jiang
  • T P Chen
  • Jingfang Zhou
  • Zuliang Du
  • Shujie Wang
  • Guoyun Wu
  • S Fung
  • C Q Sun

Detail Information

Publications9

  1. pmc Nanopatterning on silicon surface using atomic force microscopy with diamond-like carbon (DLC)-coated Si probe
    Xiaohong Jiang
    Key Laboratory of Special Functional Materials of Ministry of Education, Henan University, Kaifeng 475004, People s Republic of China
    Nanoscale Res Lett 6:518. 2011
    ..DLC-coated Si probe has the potential to be an alternative in AFM-based scratch nanofabrication on hard surfaces...
  2. ncbi Recent developments in nanofabrication using focused ion beams
    Ampere A Tseng
    Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, Arizona 85287 6106, USA
    Small 1:924-39. 2005
    ..Finally, concluding remarks are provided where the strength and weakness of the techniques studied are summarized and the scopes for technological improvement and future research are recommended...
  3. ncbi Recent developments in nanofabrication using ion projection lithography
    Ampere A Tseng
    Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, AZ 85287 6106, USA
    Small 1:594-608. 2005
    ..Finally, concluding remarks are presented to summarize the strengths and weaknesses of the current technology and to suggest the scope for future improvement...
  4. doi Removing material using atomic force microscopy with single- and multiple-tip sources
    Ampere A Tseng
    School for Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, Arizona 85287 6106, USA
    Small 7:3409-27. 2011
    ....
  5. ncbi Manipulations of atoms and molecules by scanning probe microscopy
    Ampere A Tseng
    Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, Arizona 85287 6106, USA
    J Nanosci Nanotechnol 7:2582-95. 2007
    ..As an AFM-based technique, the dip-pen nanolithography is also included. Finally, concluding remarks on technological improvement and future research is provided...
  6. ncbi Nanoscale fabrication by nonconventional approaches
    Ampere A Tseng
    Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, Arizona 85287 6106, USA
    J Nanosci Nanotechnol 5:683-702. 2005
    ..Finally, concluding remarks are provided to summarize the major technologies studied and to recommend the scopes for technology improvement and future research...
  7. ncbi Nanomachining of permalloy for fabricating nanoscale ferromagnetic structures using atomic force microscopy
    Ampere A Tseng
    Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, Arizona 85287 6106, USA
    J Nanosci Nanotechnol 10:456-66. 2010
    ..The AFM machining technique is indeed simple and predictable for machining nanostructures with specified dimension and controllable precision...
  8. ncbi Profile uniformity of overlapped oxide dots induced by atomic force microscopy
    Ampere A Tseng
    Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, Arizona 85287 6106, USA
    J Nanosci Nanotechnol 10:4390-9. 2010
    ..Indeed, by following the uniformity criteria developed, uniform and reliable oxide lines can be obtained by overlapping oxide dots...
  9. ncbi Energy shifts of Si oxidation states in the system of Si nanocrystals embedded in SiO2 matrix
    T P Chen
    School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore
    J Nanosci Nanotechnol 7:2506-10. 2007
    ..It is shown that the chemical structures of the system are similar to those of the conventional SiO2/Si system in terms of the energy shifts...