T T Fister

Summary

Affiliation: Argonne National Laboratory
Country: USA

Publications

  1. ncbi request reprint Total-reflection inelastic X-ray scattering from a 10-nm thick La0.6Sr0.4CoO3 thin film
    T T Fister
    Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
    Phys Rev Lett 106:037401. 2011
  2. ncbi request reprint Electronic structure of lithium battery interphase compounds: comparison between inelastic x-ray scattering measurements and theory
    Tim T Fister
    Chemical Sciences and Engineering Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
    J Chem Phys 135:224513. 2011
  3. doi request reprint Modular instrument mounting system for variable environment in operando X-ray experiments
    C M Folkman
    Materials Science Division, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439, USA
    Rev Sci Instrum 84:025111. 2013
  4. ncbi request reprint Equilibrium polarization of ultrathin PbTiO3 with surface compensation controlled by oxygen partial pressure
    M J Highland
    Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
    Phys Rev Lett 107:187602. 2011

Collaborators

  • M J Highland
  • C M Folkman
  • J A Eastman
  • P H Fuoss
  • D D Fong
  • E Perret
  • H Zhou
  • P M Baldo
  • S K Kim
  • S Seifert
  • Carol Thompson
  • S K Streiffer
  • G B Stephenson

Detail Information

Publications4

  1. ncbi request reprint Total-reflection inelastic X-ray scattering from a 10-nm thick La0.6Sr0.4CoO3 thin film
    T T Fister
    Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
    Phys Rev Lett 106:037401. 2011
    ....
  2. ncbi request reprint Electronic structure of lithium battery interphase compounds: comparison between inelastic x-ray scattering measurements and theory
    Tim T Fister
    Chemical Sciences and Engineering Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
    J Chem Phys 135:224513. 2011
    ..These results provide an analytical and diagnostic foundation for better understanding of the makeup of SEIs and the mechanism of their formation...
  3. doi request reprint Modular instrument mounting system for variable environment in operando X-ray experiments
    C M Folkman
    Materials Science Division, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439, USA
    Rev Sci Instrum 84:025111. 2013
    ..We have utilized the system with several different modular instruments. As an example, we provide in situ sputtering results, where the growth dynamics of epitaxial LaGaO thin films on (001) SrTiO substrates were investigated...
  4. ncbi request reprint Equilibrium polarization of ultrathin PbTiO3 with surface compensation controlled by oxygen partial pressure
    M J Highland
    Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
    Phys Rev Lett 107:187602. 2011
    ..The paraelectric phase is stabilized at intermediate pO(2) when the concentrations of surface species are insufficient to compensate either polar orientation...