Chung W See

Summary

Affiliation: University of Nottingham
Country: UK

Publications

  1. ncbi Proximity projection grating structured light illumination microscopy
    Chung W See
    Division of Electrical Systems and Optics, Applied Optics Group, Tower Building, University of Nottingham, University Park, Nottingham, NG7 2RD, UK
    Appl Opt 49:6570-6. 2010
  2. ncbi Polarization modulation thermal lens microscopy for imaging the orientation of non-spherical nanoparticles
    Jing Zhang
    IBiOS, Department of Electrical and Electronic Engineering, University of Nottingham, UK
    Opt Express 19:2643-8. 2011
  3. ncbi Wide-field high-resolution surface-plasmon interference microscopy
    Michael G Somekh
    Institute of Biophysics Imaging and Optical Science, University of Nottingham, University Park, Nottingham NG7 2RD, United Kingdom
    Opt Lett 34:3110-2. 2009

Detail Information

Publications3

  1. ncbi Proximity projection grating structured light illumination microscopy
    Chung W See
    Division of Electrical Systems and Optics, Applied Optics Group, Tower Building, University of Nottingham, University Park, Nottingham, NG7 2RD, UK
    Appl Opt 49:6570-6. 2010
    ..We will present experimental results to demonstrate the principle of the technique, and will show that, theoretically, it can achieve an imaging NA approaching 4...
  2. ncbi Polarization modulation thermal lens microscopy for imaging the orientation of non-spherical nanoparticles
    Jing Zhang
    IBiOS, Department of Electrical and Electronic Engineering, University of Nottingham, UK
    Opt Express 19:2643-8. 2011
    ..The technique, its implementation and experiment results are presented...
  3. ncbi Wide-field high-resolution surface-plasmon interference microscopy
    Michael G Somekh
    Institute of Biophysics Imaging and Optical Science, University of Nottingham, University Park, Nottingham NG7 2RD, United Kingdom
    Opt Lett 34:3110-2. 2009
    ..The presented images demonstrate contrast reversals at different defocus while retaining submicrometer lateral resolution. The contrast mechanisms are discussed as well as the instrumental requirements of the technique...