Xiangqian Jiang

Summary

Affiliation: University of Huddersfield
Country: UK

Publications

  1. ncbi request reprint Precision surface measurement
    X Jiang
    Centre for Precision Technologies, School of Computing and Engineering, University of Huddersfield, Huddersfield, UK
    Philos Transact A Math Phys Eng Sci 370:4089-114. 2012
  2. ncbi request reprint Precision metrology
    X Jiang
    Centre for Precision Technologies, School of Computing and Engineering, University of Huddersfield, Huddersfield, UK
    Philos Transact A Math Phys Eng Sci 370:4154-60. 2012
  3. doi request reprint Fast surface measurement using wavelength scanning interferometry with compensation of environmental noise
    Xiangqian Jiang
    Centre for Precision Technologies, School of Computing and Engineering, University of Huddersfield, Huddersfield HD1 3DH, United Kingdom
    Appl Opt 49:2903-9. 2010
  4. doi request reprint Comparison study of algorithms and accuracy in the wavelength scanning interferometry
    Hussam Muhamedsalih
    Centre for Precision Technologies, University of Huddersfield, Huddersfield, UK
    Appl Opt 51:8854-62. 2012
  5. doi request reprint Surface and thickness measurement of a transparent film using wavelength scanning interferometry
    Feng Gao
    Centre for Precision Technologies, University of Huddersfield, Huddersfield, HD1 3DH, UK
    Opt Express 20:21450-6. 2012

Collaborators

  • Hussam Muhamedsalih
  • Feng Gao

Detail Information

Publications5

  1. ncbi request reprint Precision surface measurement
    X Jiang
    Centre for Precision Technologies, School of Computing and Engineering, University of Huddersfield, Huddersfield, UK
    Philos Transact A Math Phys Eng Sci 370:4089-114. 2012
    ..This is expected to facilitate advanced surface manufacture over a wide range of sectors, including large science programmes and high-technology engineering...
  2. ncbi request reprint Precision metrology
    X Jiang
    Centre for Precision Technologies, School of Computing and Engineering, University of Huddersfield, Huddersfield, UK
    Philos Transact A Math Phys Eng Sci 370:4154-60. 2012
    ..The discussion covered three areas, namely the function of engineering parts, their measurement and their manufacture, as well as their interactions...
  3. doi request reprint Fast surface measurement using wavelength scanning interferometry with compensation of environmental noise
    Xiangqian Jiang
    Centre for Precision Technologies, School of Computing and Engineering, University of Huddersfield, Huddersfield HD1 3DH, United Kingdom
    Appl Opt 49:2903-9. 2010
    ..The measurement results of the semiconductor daughterboard, under mechanical disturbance, showed that the system can withstand environmental noise...
  4. doi request reprint Comparison study of algorithms and accuracy in the wavelength scanning interferometry
    Hussam Muhamedsalih
    Centre for Precision Technologies, University of Huddersfield, Huddersfield, UK
    Appl Opt 51:8854-62. 2012
    ..Experimental results demonstrate that the accuracy of measuring surface height varies from micrometer to nanometer value depending on the algorithm used to analyze the captured interferograms...
  5. doi request reprint Surface and thickness measurement of a transparent film using wavelength scanning interferometry
    Feng Gao
    Centre for Precision Technologies, University of Huddersfield, Huddersfield, HD1 3DH, UK
    Opt Express 20:21450-6. 2012
    ..Experiments on thin film layers of Parylene N coated on a glass slide surface are studied and analyzed. Comparison study results with other contact and non-contact methods are also presented...