Konstantinos Falaggis

Summary

Country: UK

Publications

  1. doi Method of excess fractions with application to absolute distance metrology: theoretical analysis
    Konstantinos Falaggis
    School of Mechanical Engineering, University of Leeds, Leeds, UK
    Appl Opt 50:5484-98. 2011
  2. doi Method of excess fractions with application to absolute distance metrology: wavelength selection and the effects of common error sources
    Konstantinos Falaggis
    School of Mechanical Engineering, University of Leeds, UK
    Appl Opt 51:6471-9. 2012
  3. ncbi Multiwavelength interferometry: extended range metrology
    Konstantinos Falaggis
    School of Mechanical Engineering, University of Leeds, Leeds, UK
    Opt Lett 34:950-2. 2009
  4. doi Absolute metrology by phase and frequency modulation for multiwavelength interferometry
    Konstantinos Falaggis
    School of Mechanical Engineering, University of Leeds, Leeds LS2 9JT, UK
    Opt Lett 36:2928-30. 2011

Detail Information

Publications4

  1. doi Method of excess fractions with application to absolute distance metrology: theoretical analysis
    Konstantinos Falaggis
    School of Mechanical Engineering, University of Leeds, Leeds, UK
    Appl Opt 50:5484-98. 2011
    ..The performance of EF, for a given phase noise, is shown to be equivalent to beat techniques but offers many alternative sets of measurement wavelengths and therefore EF offer significantly greater flexibility in experimental design...
  2. doi Method of excess fractions with application to absolute distance metrology: wavelength selection and the effects of common error sources
    Konstantinos Falaggis
    School of Mechanical Engineering, University of Leeds, UK
    Appl Opt 51:6471-9. 2012
    ..Furthermore, the effects of wavelength uncertainty allow the ultimate performance of an MWI interferometer to be estimated...
  3. ncbi Multiwavelength interferometry: extended range metrology
    Konstantinos Falaggis
    School of Mechanical Engineering, University of Leeds, Leeds, UK
    Opt Lett 34:950-2. 2009
    ..16 mm, or a dynamic range of 1 part in 2.4x10(6). With improved phase resolution the method has the potential to range over >100 m using femtosecond laser frequency comb sources...
  4. doi Absolute metrology by phase and frequency modulation for multiwavelength interferometry
    Konstantinos Falaggis
    School of Mechanical Engineering, University of Leeds, Leeds LS2 9JT, UK
    Opt Lett 36:2928-30. 2011
    ..Combined with a two (or three) wavelength interferometer, this technique has the potential for ultrahigh dynamic range metrology ranging over several meters while preserving subfringe resolution and a low system complexity...