J R Knab

Summary

Affiliation: Delft University of Technology
Country: The Netherlands

Publications

  1. ncbi request reprint Terahertz near-field vectorial imaging of subwavelength apertures and aperture arrays
    J R Knab
    Delft University of Technology, Faculty of Applied Sciences, Department of Imaging Science and Technology, Optics Research Group, Lorentzweg 1, 2628 CJ Delft, The Netherlands
    Opt Express 17:15072-86. 2009
  2. doi request reprint Influence of the dielectric substrate on the terahertz electric near-field of a hole in a metal
    L Guestin
    Delft University of Technology, Faculty of Applied Sciences, Department of Imaging Science and Technology, Optics Research Group Lorentzweg 1, 2628 CJ Delft, The Netherlands
    Opt Express 17:17412-25. 2009
  3. doi request reprint Terahertz near-field spectroscopy of filled subwavelength sized apertures in thin metal films
    J R Knab
    Department of Imaging Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Delft, The Netherlands
    Opt Express 21:1101-12. 2013

Collaborators

  • M A Seo
  • L Guestin
  • A J L Adam
  • M Nagel
  • P C M Planken

Detail Information

Publications3

  1. ncbi request reprint Terahertz near-field vectorial imaging of subwavelength apertures and aperture arrays
    J R Knab
    Delft University of Technology, Faculty of Applied Sciences, Department of Imaging Science and Technology, Optics Research Group, Lorentzweg 1, 2628 CJ Delft, The Netherlands
    Opt Express 17:15072-86. 2009
    ..These measurements illustrate in detail the individual THz field components emerging from subwavelength apertures and provide a direct measure of two important mechanisms that contribute to the net transmission of light through arrays...
  2. doi request reprint Influence of the dielectric substrate on the terahertz electric near-field of a hole in a metal
    L Guestin
    Delft University of Technology, Faculty of Applied Sciences, Department of Imaging Science and Technology, Optics Research Group Lorentzweg 1, 2628 CJ Delft, The Netherlands
    Opt Express 17:17412-25. 2009
    ..Our results validate the -somewhat unusual- two-dimensional field distribution measured beneath a hole in a thick metal foil and highlight the effect that a substrate can have on the measurement of the near-field of an object...
  3. doi request reprint Terahertz near-field spectroscopy of filled subwavelength sized apertures in thin metal films
    J R Knab
    Department of Imaging Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Delft, The Netherlands
    Opt Express 21:1101-12. 2013
    ..We show that the ability to measure in the near-field of the apertures, where signals are relatively strong, allows us to measure on sample volumes as small as ~5×10(-16) m(3)...