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Swiss Center for Electronics and Microtechnology
> Revol > Vincent Revol
Research Topics
interferometry
radiography
uncertainty
stochastic processes
Vincent Revol
Summary
Affiliation:
Swiss Center for Electronics and Microtechnology
Country:
Switzerland
Publications
Noise analysis of grating-based x-ray differential phase contrast imaging
Vincent Revol
Photonics Division, CSEM SA, 8005 Zurich, Switzerland
Rev Sci Instrum
81:073709. 2010
Detail Information
Publications
1
Noise analysis of grating-based x-ray differential phase contrast imaging
Vincent Revol
Photonics Division, CSEM SA, 8005 Zurich, Switzerland
Rev Sci Instrum
81:073709. 2010
..Our conclusions provide general guidelines to optimize grating interferometers for specific applications and problems...