C Kottler

Summary

Affiliation: Swiss Center for Electronics and Microtechnology
Country: Switzerland

Publications

  1. ncbi Grating interferometer based scanning setup for hard X-ray phase contrast imaging
    C Kottler
    Paul Scherrer Institut, CH 5232 Villigen PSI, Switzerland
    Rev Sci Instrum 78:043710. 2007
  2. ncbi Hard x-ray phase tomography with low-brilliance sources
    F Pfeiffer
    Paul Scherrer Institut, CH 5232 Villigen PSI, Switzerland
    Phys Rev Lett 98:108105. 2007

Collaborators

  • F Pfeiffer
  • O Bunk
  • C David

Detail Information

Publications2

  1. ncbi Grating interferometer based scanning setup for hard X-ray phase contrast imaging
    C Kottler
    Paul Scherrer Institut, CH 5232 Villigen PSI, Switzerland
    Rev Sci Instrum 78:043710. 2007
    ....
  2. ncbi Hard x-ray phase tomography with low-brilliance sources
    F Pfeiffer
    Paul Scherrer Institut, CH 5232 Villigen PSI, Switzerland
    Phys Rev Lett 98:108105. 2007
    ....