Antonio Consoli

Summary

Country: Spain

Publications

  1. doi request reprint Pulse shortening of gain switched single mode semiconductor lasers using a variable delay interferometer
    Antonio Consoli
    Departamento de Tecnología Fotónica y Bioingeniería CEMDATIC, Universidad Politecnica de Madrid, Ciudad Universitaria 28040 Madrid, Spain
    Opt Express 20:22481-9. 2012
  2. doi request reprint Time resolved chirp measurements of gain switched semiconductor laser using a polarization based optical differentiator
    Antonio Consoli
    Departamento de Tecnología Fotónica, Universidad Politecnica de Madrid, ETSI de Telecomunicación, Ciudad Universitaria, 28040 Madrid, Spain
    Opt Express 19:10805-12. 2011
  3. doi request reprint Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers
    Antonio Consoli
    Departamento de Tecnología Fotónica, Universidad Politecnica de Madrid, ETSI de Telecomunicación, Ciudad Universitaria 28040 Madrid, Spain
    Opt Express 20:4979-87. 2012

Detail Information

Publications3

  1. doi request reprint Pulse shortening of gain switched single mode semiconductor lasers using a variable delay interferometer
    Antonio Consoli
    Departamento de Tecnología Fotónica y Bioingeniería CEMDATIC, Universidad Politecnica de Madrid, Ciudad Universitaria 28040 Madrid, Spain
    Opt Express 20:22481-9. 2012
    ..5 µm, obtaining pulse duration reduction of 25-30%. The main asset of the proposed technique is that it can be applied to different devices and pulses, taking advantage of the flexibility of the gain switching technique...
  2. doi request reprint Time resolved chirp measurements of gain switched semiconductor laser using a polarization based optical differentiator
    Antonio Consoli
    Departamento de Tecnología Fotónica, Universidad Politecnica de Madrid, ETSI de Telecomunicación, Ciudad Universitaria, 28040 Madrid, Spain
    Opt Express 19:10805-12. 2011
    ..The technique is validated by comparing the measured pulse spectra with the reconstructed spectra obtained from the intensity and the recovered phase...
  3. doi request reprint Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers
    Antonio Consoli
    Departamento de Tecnología Fotónica, Universidad Politecnica de Madrid, ETSI de Telecomunicación, Ciudad Universitaria 28040 Madrid, Spain
    Opt Express 20:4979-87. 2012
    ..The method is applied to a VCSEL and to a DFB laser emitting around 1550 nm at different temperatures, obtaining a measurement error lower than ± 8%...