M F Cerqueira

Summary

Affiliation: University of Minho
Country: Portugal

Publications

  1. ncbi Resonant Raman scattering in ZnO:Mn and ZnO:Mn:Al thin films grown by RF sputtering
    M F Cerqueira
    Centro de Fisica, Campus de Gualtar, Universidade do Minho, 4710 057 Braga, Portugal
    J Phys Condens Matter 23:334205. 2011
  2. ncbi Electrical and Raman scattering studies of ZnO:P and ZnO:Sb thin films
    J Ayres de Campos
    , Universidade do Minho, Campus de Gualtar 4710 057 Braga, Portugal
    J Nanosci Nanotechnol 10:2620-3. 2010
  3. ncbi ZnO thin films implanted with Al, Sb and P: optical, structural and electrical characterization
    T Viseu
    , Universidade do Minho, Campus de Gualtar 4710 057 Braga, Portugal
    J Nanosci Nanotechnol 9:3574-7. 2009
  4. ncbi Crystal size and crystalline volume fraction effects on the Erbium emission of nc-Si:Er grown by r.f. sputtering
    M F Cerqueira
    , Universidade do Minho, Campus de Gualtar 4710 057 Braga, Portugal
    J Nanosci Nanotechnol 10:2663-8. 2010

Collaborators

  • J Ayres de Campos
  • T Viseu
  • E Alves
  • A G Rolo
  • N P Barradas

Detail Information

Publications4

  1. ncbi Resonant Raman scattering in ZnO:Mn and ZnO:Mn:Al thin films grown by RF sputtering
    M F Cerqueira
    Centro de Fisica, Campus de Gualtar, Universidade do Minho, 4710 057 Braga, Portugal
    J Phys Condens Matter 23:334205. 2011
    ....
  2. ncbi Electrical and Raman scattering studies of ZnO:P and ZnO:Sb thin films
    J Ayres de Campos
    , Universidade do Minho, Campus de Gualtar 4710 057 Braga, Portugal
    J Nanosci Nanotechnol 10:2620-3. 2010
    ..The electric resistivity reaches values of 0.012 (omega cm) and 0.042 (omega cm) for the P and Sb-doped samples, respectively...
  3. ncbi ZnO thin films implanted with Al, Sb and P: optical, structural and electrical characterization
    T Viseu
    , Universidade do Minho, Campus de Gualtar 4710 057 Braga, Portugal
    J Nanosci Nanotechnol 9:3574-7. 2009
    ..90 (Omegacm)(-1) in the P-doped, 10.33 (Omegacm)(-1) in the Al-doped and 0.56 (Omegacm)(-1) in the Sb-doped samples...
  4. ncbi Crystal size and crystalline volume fraction effects on the Erbium emission of nc-Si:Er grown by r.f. sputtering
    M F Cerqueira
    , Universidade do Minho, Campus de Gualtar 4710 057 Braga, Portugal
    J Nanosci Nanotechnol 10:2663-8. 2010
    ..We discuss the temperature dependence of the Er3+ emission as well as the possible explanations of the low Er active fraction...