Y Pavan Kumar

Summary

Publications

  1. doi request reprint Thickness measurement of transparent glass plates using a lateral shearing cyclic path optical configuration setup and polarization phase shifting interferometry
    Y Pavan Kumar
    Department of Atomic Energy, Raja Ramanna Centre for Advanced Technology, Government of India, Indore 452013, India
    Appl Opt 49:6552-7. 2010
  2. doi request reprint Simultaneous determination of refractive index and thickness of moderately thick plane-parallel transparent glass plates using cyclic path optical configuration setup and a lateral shearing interferometer
    Y Pavan Kumar
    Department of Atomic Energy, Raja Ramanna Centre for Advanced Technology, Government of India, Indore 452013, India
    Appl Opt 51:3533-7. 2012
  3. ncbi request reprint Simultaneous measurement of refractive index and wedge angle of optical windows using Fizeau interferometry and a cyclic path optical configuration
    Y Pavan Kumar
    Department of Atomic Energy, Raja Ramanna Centre for Advanced Technology, Government of India, Indore 452013, India
    Appl Opt 48:4756-61. 2009
  4. doi request reprint Measurement of longitudinal displacement using lateral shearing cyclic path optical configuration setup and phase shifting interferometry
    Y Pavan Kumar
    Department of Atomic Energy, Raja Ramanna Centre for Advanced Technology, Government of India, Indore 452013, India
    Appl Opt 50:1350-5. 2011
  5. ncbi request reprint Opaque optics thickness measurement using a cyclic path optical configuration setup and polarization phase shifting interferometry
    Y Pavan Kumar
    Department of Atomic Energy, Raja Ramanna Centre for Advanced Technology, Government of India, Indore 452013, India
    Appl Opt 51:1352-6. 2012
  6. ncbi request reprint Simple technique for the generation of white-light Haidinger fringes with cyclic optical configuration
    Sanjib Chatterjee
    Department of Atomic Energy, Raja Ramanna Centre for Advanced Technology, Government of India, Indore 452013, India
    Opt Lett 34:1291-3. 2009

Collaborators

  • Sanjib Chatterjee

Detail Information

Publications6

  1. doi request reprint Thickness measurement of transparent glass plates using a lateral shearing cyclic path optical configuration setup and polarization phase shifting interferometry
    Y Pavan Kumar
    Department of Atomic Energy, Raja Ramanna Centre for Advanced Technology, Government of India, Indore 452013, India
    Appl Opt 49:6552-7. 2010
    ..The thickness of the GP is determined from the standard relation between the longitudinal shift of the focus introduced by the GP and the thickness of the GP. Results obtained for a GP of 9.810mm thickness are presented...
  2. doi request reprint Simultaneous determination of refractive index and thickness of moderately thick plane-parallel transparent glass plates using cyclic path optical configuration setup and a lateral shearing interferometer
    Y Pavan Kumar
    Department of Atomic Energy, Raja Ramanna Centre for Advanced Technology, Government of India, Indore 452013, India
    Appl Opt 51:3533-7. 2012
    ..The RI is obtained by dividing the real thickness with apparent thickness of the GP. Presented in this paper are the results obtained for a test GP with a thickness of 14.983 mm and a RI of 1.515...
  3. ncbi request reprint Simultaneous measurement of refractive index and wedge angle of optical windows using Fizeau interferometry and a cyclic path optical configuration
    Y Pavan Kumar
    Department of Atomic Energy, Raja Ramanna Centre for Advanced Technology, Government of India, Indore 452013, India
    Appl Opt 48:4756-61. 2009
    ..The wedge angle is determined from the evaluated values of the refractive index and Fizeau fringe spacing. The results obtained for a BK-7 optical window are presented...
  4. doi request reprint Measurement of longitudinal displacement using lateral shearing cyclic path optical configuration setup and phase shifting interferometry
    Y Pavan Kumar
    Department of Atomic Energy, Raja Ramanna Centre for Advanced Technology, Government of India, Indore 452013, India
    Appl Opt 50:1350-5. 2011
    ..The novelty of the technique is the introduction of CPOC for the distance measurement. The advantages of the technique compared to other related methods are discussed...
  5. ncbi request reprint Opaque optics thickness measurement using a cyclic path optical configuration setup and polarization phase shifting interferometry
    Y Pavan Kumar
    Department of Atomic Energy, Raja Ramanna Centre for Advanced Technology, Government of India, Indore 452013, India
    Appl Opt 51:1352-6. 2012
    ..The results obtained for a silicon plate of thickness 0.660 mm with a measurement uncertainty of 0.013 mm are presented...
  6. ncbi request reprint Simple technique for the generation of white-light Haidinger fringes with cyclic optical configuration
    Sanjib Chatterjee
    Department of Atomic Energy, Raja Ramanna Centre for Advanced Technology, Government of India, Indore 452013, India
    Opt Lett 34:1291-3. 2009
    ..Differences of the fringes with common Haidinger fringes have been discussed, and the result obtained with a white-light source is presented...