Research Topics
| Soichi OtsukiSummaryAffiliation: National Institute of Advanced Industrial Science and Technology Country: Japan Publications
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Detail Information
Publications
Two-dimensional thickness measurements based on internal reflection ellipsometrySoichi Otsuki
Single Molecule Bioanalysis Laboratory, National Institute of Advanced Industrial Science and Technology AIST, Hayashi cho, Takamatsu 761 0395, Japan
Appl Opt 44:1410-5. 2005..2 nm. These findings validate the optical effect of a high-index additional layer to improve the sensitivity and precision of thickness measurements of the sample film on transparent substrates...
Wavelength-scanning surface plasmon resonance imagingSoichi Otsuki
Single Molecule Bioanalysis Laboratory, National Institute of Advanced Industrial Science and Technology, Hayashi cho, Takamatsu 761 0395, Japan
Appl Opt 44:3468-72. 2005..An array of protein thin layers on a gold film was evaluated in air to present the layers' surface structure in nanometer scale...
Polarization modulation imaging ellipsometerSoichi Otsuki
Health Technology Research Center, National Institute of Advanced Industrial Science and Technology, Kagawa, Japan
Opt Lett 32:130-2. 2007..The thickness resolution for imaging and the temporal noise in parallel thickness measurements were smaller than +/-0.1 nm and smaller than +/-0.02 nm, respectively...
Wavelength-scanning surface plasmon resonance imaging for label-free multiplexed protein microarray assaySoichi Otsuki
Health Research Institute, National Institute of Advanced Industrial Science and Technology AIST, Hayashi cho, Takamatsu 761 0395, Japan
Biosens Bioelectron 26:202-6. 2010..The limit of detection was 20 pm in SPR wavelength corresponding to 5 pm in thickness...
Internal reflection ellipsometry in air and water ambientSoichi Otsuki
Health Research Institute, National Institute of Advanced Industrial Science and Technology AIST, Hayashi cho, Takamatsu, Kagawa 761 0395, Japan
Opt Lett 35:4226-8. 2010..This verified that IRE is useful in measurement and analysis of thin films on transparent substrates and especially effective to study thin films at transparent substrate-liquid interfaces...
