Soichi Otsuki

Summary

Affiliation: National Institute of Advanced Industrial Science and Technology
Country: Japan

Publications

  1. ncbi request reprint Two-dimensional thickness measurements based on internal reflection ellipsometry
    Soichi Otsuki
    Single Molecule Bioanalysis Laboratory, National Institute of Advanced Industrial Science and Technology AIST, Hayashi cho, Takamatsu 761 0395, Japan
    Appl Opt 44:1410-5. 2005
  2. ncbi request reprint Wavelength-scanning surface plasmon resonance imaging
    Soichi Otsuki
    Single Molecule Bioanalysis Laboratory, National Institute of Advanced Industrial Science and Technology, Hayashi cho, Takamatsu 761 0395, Japan
    Appl Opt 44:3468-72. 2005
  3. ncbi request reprint Polarization modulation imaging ellipsometer
    Soichi Otsuki
    Health Technology Research Center, National Institute of Advanced Industrial Science and Technology, Kagawa, Japan
    Opt Lett 32:130-2. 2007
  4. doi request reprint Wavelength-scanning surface plasmon resonance imaging for label-free multiplexed protein microarray assay
    Soichi Otsuki
    Health Research Institute, National Institute of Advanced Industrial Science and Technology AIST, Hayashi cho, Takamatsu 761 0395, Japan
    Biosens Bioelectron 26:202-6. 2010
  5. ncbi request reprint Internal reflection ellipsometry in air and water ambient
    Soichi Otsuki
    Health Research Institute, National Institute of Advanced Industrial Science and Technology AIST, Hayashi cho, Takamatsu, Kagawa 761 0395, Japan
    Opt Lett 35:4226-8. 2010

Detail Information

Publications5

  1. ncbi request reprint Two-dimensional thickness measurements based on internal reflection ellipsometry
    Soichi Otsuki
    Single Molecule Bioanalysis Laboratory, National Institute of Advanced Industrial Science and Technology AIST, Hayashi cho, Takamatsu 761 0395, Japan
    Appl Opt 44:1410-5. 2005
    ..2 nm. These findings validate the optical effect of a high-index additional layer to improve the sensitivity and precision of thickness measurements of the sample film on transparent substrates...
  2. ncbi request reprint Wavelength-scanning surface plasmon resonance imaging
    Soichi Otsuki
    Single Molecule Bioanalysis Laboratory, National Institute of Advanced Industrial Science and Technology, Hayashi cho, Takamatsu 761 0395, Japan
    Appl Opt 44:3468-72. 2005
    ..An array of protein thin layers on a gold film was evaluated in air to present the layers' surface structure in nanometer scale...
  3. ncbi request reprint Polarization modulation imaging ellipsometer
    Soichi Otsuki
    Health Technology Research Center, National Institute of Advanced Industrial Science and Technology, Kagawa, Japan
    Opt Lett 32:130-2. 2007
    ..The thickness resolution for imaging and the temporal noise in parallel thickness measurements were smaller than +/-0.1 nm and smaller than +/-0.02 nm, respectively...
  4. doi request reprint Wavelength-scanning surface plasmon resonance imaging for label-free multiplexed protein microarray assay
    Soichi Otsuki
    Health Research Institute, National Institute of Advanced Industrial Science and Technology AIST, Hayashi cho, Takamatsu 761 0395, Japan
    Biosens Bioelectron 26:202-6. 2010
    ..The limit of detection was 20 pm in SPR wavelength corresponding to 5 pm in thickness...
  5. ncbi request reprint Internal reflection ellipsometry in air and water ambient
    Soichi Otsuki
    Health Research Institute, National Institute of Advanced Industrial Science and Technology AIST, Hayashi cho, Takamatsu, Kagawa 761 0395, Japan
    Opt Lett 35:4226-8. 2010
    ..This verified that IRE is useful in measurement and analysis of thin films on transparent substrates and especially effective to study thin films at transparent substrate-liquid interfaces...