Hideki Maruyama

Summary

Country: Japan

Publications

  1. ncbi request reprint Low-coherence interferometer system for the simultaneous measurement of refractive index and thickness
    Hideki Maruyama
    Research and Development Laboratory, Kyushu Matsushita Electric Company, Ltd, Fukuoka, Japan
    Appl Opt 41:1315-22. 2002

Collaborators

Detail Information

Publications1

  1. ncbi request reprint Low-coherence interferometer system for the simultaneous measurement of refractive index and thickness
    Hideki Maruyama
    Research and Development Laboratory, Kyushu Matsushita Electric Company, Ltd, Fukuoka, Japan
    Appl Opt 41:1315-22. 2002
    ..In addition, a measurement accuracy of less than 1% is achieved even when the sample is as thin as 20 microm. The measurement time is also 3 min or more...