Frank Brückner

Summary

Affiliation: Friedrich Schiller University
Country: Germany

Publications

  1. ncbi Demonstration of a cavity coupler based on a resonant waveguide grating
    Frank Brückner
    Institut fur Angewandte Physik, Friedrich Schiller Universitat Jena, Jena, Germany
    Opt Express 17:163-9. 2009
  2. ncbi Encapsulated subwavelength grating as a quasi-monolithic resonant reflector
    Frank Brückner
    Institut fur Angewandte Physik, Friedrich Schiller Universitat Jena, Max Wien Platz 1, 07743 Jena, Germany
    Opt Express 17:24334-41. 2009
  3. ncbi Realization of a monolithic high-reflectivity cavity mirror from a single silicon crystal
    Frank Brückner
    Institut fur Angewandte Physik, Friedrich Schiller Universitat Jena, Max Wien Platz 1, 07743 Jena, Germany
    Phys Rev Lett 104:163903. 2010
  4. ncbi Widely tunable monolithic narrowband grating filter for near-infrared radiation
    Frank Brückner
    Institut fur Angewandte Physik, Friedrich Schiller Universitat Jena, Jena, Germany
    Opt Lett 36:436-8. 2011
  5. ncbi Enhanced angular tolerance of resonant waveguide grating reflectors
    Stefanie Kroker
    Institut fur Angewandte Physik, Friedrich Schiller Universitat Jena, Jena, Germany
    Opt Lett 36:537-9. 2011
  6. ncbi Reflective cavity couplers based on resonant waveguide gratings
    Stefanie Kroker
    Institut fur Angewandte Physik, Friedrich Schiller Universitat Jena, Max Wien Platz 1, 07743 Jena, Germany
    Opt Express 19:16466-79. 2011

Collaborators

  • Roman Schnabel
  • Stefanie Kroker
  • Andreas Tünnermann
  • Ernst Bernhard Kley
  • Frank Fuchs
  • Thomas Käsebier

Detail Information

Publications6

  1. ncbi Demonstration of a cavity coupler based on a resonant waveguide grating
    Frank Brückner
    Institut fur Angewandte Physik, Friedrich Schiller Universitat Jena, Jena, Germany
    Opt Express 17:163-9. 2009
    ..The cavity coupler was incorporated into a Fabry-Perot resonator together with a conventional high quality mirror. The finesse of this cavity was measured to be F = 657, which corresponds to a coupler reflectivity of R = 99.08 %...
  2. ncbi Encapsulated subwavelength grating as a quasi-monolithic resonant reflector
    Frank Brückner
    Institut fur Angewandte Physik, Friedrich Schiller Universitat Jena, Max Wien Platz 1, 07743 Jena, Germany
    Opt Express 17:24334-41. 2009
    ..Our reflector is an encapsulated subwavelength grating that is based on silicon. We measured a high reflectivity of 93% for a wavelength of lambda = 1.55 microm under normal incidence. Perfect reflectivities are possible in theory...
  3. ncbi Realization of a monolithic high-reflectivity cavity mirror from a single silicon crystal
    Frank Brückner
    Institut fur Angewandte Physik, Friedrich Schiller Universitat Jena, Max Wien Platz 1, 07743 Jena, Germany
    Phys Rev Lett 104:163903. 2010
    ..79+/-0.01)% at a wavelength of 1.55 microm, and achieved a cavity finesse of 2784. We anticipate that our achievement will open the avenue to next generation high-precision experiments targeting fundamental questions of physics...
  4. ncbi Widely tunable monolithic narrowband grating filter for near-infrared radiation
    Frank Brückner
    Institut fur Angewandte Physik, Friedrich Schiller Universitat Jena, Jena, Germany
    Opt Lett 36:436-8. 2011
    ..The filter performance in terms of linewidth and contrast is essentially preserved over the entire tuning interval...
  5. ncbi Enhanced angular tolerance of resonant waveguide grating reflectors
    Stefanie Kroker
    Institut fur Angewandte Physik, Friedrich Schiller Universitat Jena, Jena, Germany
    Opt Lett 36:537-9. 2011
    ..Our approach might have compelling applications as new diffractive-reflective optical components with low-coating thermal noise in the field of high-precision metrology...
  6. ncbi Reflective cavity couplers based on resonant waveguide gratings
    Stefanie Kroker
    Institut fur Angewandte Physik, Friedrich Schiller Universitat Jena, Max Wien Platz 1, 07743 Jena, Germany
    Opt Express 19:16466-79. 2011
    ..With a total effective layer thickness not exceeding 1.1 μm the discussed approaches are expected to remarkably reduce the urgent problem of coating thermal noise of conventional components for high-precision metrology...