Claude Amra

Summary

Affiliation: Institut Fresnel
Country: France

Publications

  1. ncbi request reprint Partial polarization of light induced by random defects at surfaces or bulks
    Claude Amra
    Institut Fresnel, UMR CNRS 6133, Aix Marseille Universités, Ecole Centrale MarseilleFaculté des Sciences et Techniques de St Jérôme, 13397 Marseille Cedex 20, France
    Opt Express 16:10372-83. 2008
  2. ncbi request reprint Statistical signatures of random media and their correlation to polarization properties
    Jacques Sorrentini
    Institut Fresnel CNRS, Universités d Aix Marseille, Ecole Centrale Marseille, Domaine Universitaire de Saint Jerome, 13397 Marseille Cedex 20, France
    Opt Lett 34:2429-31. 2009
  3. doi request reprint Transformation thermodynamics: cloaking and concentrating heat flux
    Sebastien Guenneau
    Institut Fresnel, UMR CNRS 6133, Aix Marseille Universite, Campus universitaire de Saint Jérôme, Marseille 13013, France
    Opt Express 20:8207-18. 2012
  4. doi request reprint Gradual loss of polarization in light scattered from rough surfaces: electromagnetic prediction
    Myriam Zerrad
    Institut Fresnel, UMR CNRS6133 Aix Marseille Universités, Ecole Centrale Marseille, Faculte des Sciences et Techniques de Saint Jerome, 13397 Marseille Cedex 20, France
    Opt Express 18:15832-43. 2010
  5. doi request reprint Optical component interface scatter characterization by selective polarization extinction
    Gaelle Georges
    Institut Fresnel, CNRS, Aix Marseille Universite, Ecole Centrale Marseille, Marseille, France
    Appl Opt 50:C349-56. 2011
  6. doi request reprint Anisotropic conductivity rotates heat fluxes in transient regimes
    Sebastien Guenneau
    Institut Fresnel, UMR CNRS 7249, Aix Marseille Universite, Campus universitaire de Saint Jérôme, Marseille 13013, France
    Opt Express 21:6578-83. 2013
  7. ncbi request reprint Coherence and polarization properties in speckle of totally depolarized light scattered by totally depolarizing media
    Philippe Refregier
    Institut Fresnel, CNRS, Aix Marseille Universite, Ecole Centrale Marseille, Campus de Saint Jérôme, 13013 Marseille, France
    Opt Lett 37:2055-7. 2012
  8. doi request reprint Optimal design for 100% absorption and maximum field enhancement in thin-film multilayers at resonances under total reflection
    Cesaire Ndiaye
    Institut Fresnel, UMR CNRS 6133 Universités d Aix Marseille, Ecole Centrale Marseille, Marseille, France
    Appl Opt 50:C382-7. 2011

Collaborators

Detail Information

Publications8

  1. ncbi request reprint Partial polarization of light induced by random defects at surfaces or bulks
    Claude Amra
    Institut Fresnel, UMR CNRS 6133, Aix Marseille Universités, Ecole Centrale MarseilleFaculté des Sciences et Techniques de St Jérôme, 13397 Marseille Cedex 20, France
    Opt Express 16:10372-83. 2008
    ..These effects are theoretically predicted and confirmed via multiscale polarization measurements in the speckle pattern of rough surfaces. "Full" polarization can be recovered when reducing the receiver aperture...
  2. ncbi request reprint Statistical signatures of random media and their correlation to polarization properties
    Jacques Sorrentini
    Institut Fresnel CNRS, Universités d Aix Marseille, Ecole Centrale Marseille, Domaine Universitaire de Saint Jerome, 13397 Marseille Cedex 20, France
    Opt Lett 34:2429-31. 2009
    ..The speckle statistics are shown to be correlated to partial polarization. Angle-resolved ellipsometric data confirm all conclusions...
  3. doi request reprint Transformation thermodynamics: cloaking and concentrating heat flux
    Sebastien Guenneau
    Institut Fresnel, UMR CNRS 6133, Aix Marseille Universite, Campus universitaire de Saint Jérôme, Marseille 13013, France
    Opt Express 20:8207-18. 2012
    ..We finally propose a multilayered cloak consisting of 20 homogeneous concentric layers with a piecewise constant isotropic diffusivity working over a finite time interval (homogenization approach)...
  4. doi request reprint Gradual loss of polarization in light scattered from rough surfaces: electromagnetic prediction
    Myriam Zerrad
    Institut Fresnel, UMR CNRS6133 Aix Marseille Universités, Ecole Centrale Marseille, Faculte des Sciences et Techniques de Saint Jerome, 13397 Marseille Cedex 20, France
    Opt Express 18:15832-43. 2010
    ..The receiver aperture is taken into account by means of a multiscale spatial averaging process. The polarization degrees are connected with the structural parameters of surfaces...
  5. doi request reprint Optical component interface scatter characterization by selective polarization extinction
    Gaelle Georges
    Institut Fresnel, CNRS, Aix Marseille Universite, Ecole Centrale Marseille, Marseille, France
    Appl Opt 50:C349-56. 2011
    ..Experimental data collected using the technique are compared with measurements made using a white-light optical surface profilometry...
  6. doi request reprint Anisotropic conductivity rotates heat fluxes in transient regimes
    Sebastien Guenneau
    Institut Fresnel, UMR CNRS 7249, Aix Marseille Universite, Campus universitaire de Saint Jérôme, Marseille 13013, France
    Opt Express 21:6578-83. 2013
    ..A structured rotator is finally proposed inspired by earlier designs of thermostatic and microwave rotators...
  7. ncbi request reprint Coherence and polarization properties in speckle of totally depolarized light scattered by totally depolarizing media
    Philippe Refregier
    Institut Fresnel, CNRS, Aix Marseille Universite, Ecole Centrale Marseille, Campus de Saint Jérôme, 13013 Marseille, France
    Opt Lett 37:2055-7. 2012
    ..We analyze the behavior of some polarization and coherence properties in such a physical situation...
  8. doi request reprint Optimal design for 100% absorption and maximum field enhancement in thin-film multilayers at resonances under total reflection
    Cesaire Ndiaye
    Institut Fresnel, UMR CNRS 6133 Universités d Aix Marseille, Ecole Centrale Marseille, Marseille, France
    Appl Opt 50:C382-7. 2011
    ..The corresponding field enhancement within the stack can be arbitrarily increased with the optimization procedure. Applications concern optical sensors and threshold lasers...