- Scanning X-ray nanodiffraction: from the experimental approach towards spatially resolved scattering simulationsMartin Dubslaff
Paul Drude Institut fur Festkorperelektronik, Hausvogteiplatz 5 7, Berlin, D 10117, Germany
Nanoscale Res Lett 7:553. 2012..The spot profile could be acquired experimentally by X-ray ptychography. Simulation results are discussed and compared with corresponding X-ray nanodiffraction experiments on single SiGe dots and dot molecules...