G Deptuch

Summary

Publications

  1. ncbi request reprint Direct electron imaging in electron microscopy with monolithic active pixel sensors
    G Deptuch
    Brookhaven National Laboratory, Upton, NY 11973, USA
    Ultramicroscopy 107:674-84. 2007

Detail Information

Publications1

  1. ncbi request reprint Direct electron imaging in electron microscopy with monolithic active pixel sensors
    G Deptuch
    Brookhaven National Laboratory, Upton, NY 11973, USA
    Ultramicroscopy 107:674-84. 2007
    ..The electron energies used range from a few keV to 30 keV for SEM and from 40 to 400 keV for TEM. Deterioration of the image resolution due to backscattering was quantified for different energies and both detector versions...