- Non-equidistant scanning approach for millimetre-sized SPM measurementsPetr Klapetek
Czech Metrology Institute, Okruzní 31, Brno, 638 00, Czech Republic
Nanoscale Res Lett 7:213. 2012..In this article, we also discuss the inﬂuence of thermal drifts on the measured data and compare the presented algorithm to the standard matrix-based measuring approach...
- Atomic force microscopy analysis of nanoparticles in non-ideal conditionsPetr Klapetek
Czech Metrology Institute, Okruzní 31, 638 00, Brno, Czech Republic
Nanoscale Res Lett 6:514. 2011..It is shown that the elimination of user influence on the data processing algorithm is a key step for obtaining accurate results while analyzing nanoparticles measured in non-ideal conditions...