Petr Klapetek

Summary

Affiliation: Czech Metrology Institute
Country: Czech Republic

Publications

  1. ncbi Non-equidistant scanning approach for millimetre-sized SPM measurements
    Petr Klapetek
    Czech Metrology Institute, Okruzní 31, Brno, 638 00, Czech Republic
    Nanoscale Res Lett 7:213. 2012
  2. ncbi Atomic force microscopy analysis of nanoparticles in non-ideal conditions
    Petr Klapetek
    Czech Metrology Institute, Okruzní 31, 638 00, Brno, Czech Republic
    Nanoscale Res Lett 6:514. 2011

Detail Information

Publications2

  1. ncbi Non-equidistant scanning approach for millimetre-sized SPM measurements
    Petr Klapetek
    Czech Metrology Institute, Okruzní 31, Brno, 638 00, Czech Republic
    Nanoscale Res Lett 7:213. 2012
    ..In this article, we also discuss the influence of thermal drifts on the measured data and compare the presented algorithm to the standard matrix-based measuring approach...
  2. ncbi Atomic force microscopy analysis of nanoparticles in non-ideal conditions
    Petr Klapetek
    Czech Metrology Institute, Okruzní 31, 638 00, Brno, Czech Republic
    Nanoscale Res Lett 6:514. 2011
    ..It is shown that the elimination of user influence on the data processing algorithm is a key step for obtaining accurate results while analyzing nanoparticles measured in non-ideal conditions...