Jian Liu

Summary

Affiliation: Harbin Institute of Technology
Country: China

Publications

  1. doi request reprint Phase-shift resolving confocal microscopy with high axial resolution, wide range and reflectance disturbance resistibility
    Jian Liu
    Ultra Precision Optoelectronic Instrument Engineering Institute, Harbin Institute of Technology, No 92, West Da Zhi Street, Harbin 150001, Heilongjiang, China
    Opt Express 17:16281-90. 2009
  2. doi request reprint Improved differential confocal microscopy with ultrahigh signal-to-noise ratio and reflectance disturbance resistibility
    Jian Liu
    Ultra Precision Optoelectronic Instrument Engineering Institute, Harbin Institute of Technology, No 92, West Da Zhi Street, Harbin 150001, Heilongjiang, China
    Appl Opt 48:6195-201. 2009
  3. doi request reprint Elliptical mirror based imaging with aperture angle greater than π/2
    Jian Liu
    Ultra precision Optoelectronic Instrument Engineering Center, Harbin Institute of Technology, Harbin 150001, Heilongjiang, China
    Opt Express 20:19206-13. 2012
  4. doi request reprint Rigorous theory on elliptical mirror focusing for point scanning microscopy
    Jian Liu
    Ultra precision Optoelectronic Instrument Engineering Center, Harbin Institute of Technology, No 92, West Da Zhi Street, Harbin 150001, Heilongjiang, China
    Opt Express 20:6175-84. 2012
  5. doi request reprint Vectorial design of super-oscillatory lens
    Tao Liu
    Center of Ultra Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150001, China
    Opt Express 21:15090-101. 2013
  6. doi request reprint Confocal simultaneous phase-shifting interferometry
    Chenguang Zhao
    Center of Ultra Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, China
    Appl Opt 50:655-61. 2011

Collaborators

  • Tao Liu
  • Chenguang Zhao
  • Jianbo Tang
  • Jiubin Tan

Detail Information

Publications6

  1. doi request reprint Phase-shift resolving confocal microscopy with high axial resolution, wide range and reflectance disturbance resistibility
    Jian Liu
    Ultra Precision Optoelectronic Instrument Engineering Institute, Harbin Institute of Technology, No 92, West Da Zhi Street, Harbin 150001, Heilongjiang, China
    Opt Express 17:16281-90. 2009
    ....
  2. doi request reprint Improved differential confocal microscopy with ultrahigh signal-to-noise ratio and reflectance disturbance resistibility
    Jian Liu
    Ultra Precision Optoelectronic Instrument Engineering Institute, Harbin Institute of Technology, No 92, West Da Zhi Street, Harbin 150001, Heilongjiang, China
    Appl Opt 48:6195-201. 2009
    ..In the case of ultrahigh SNR, the axial resolution reaches 1 nm when NA=0.75 and lambda=632.8 nm...
  3. doi request reprint Elliptical mirror based imaging with aperture angle greater than π/2
    Jian Liu
    Ultra precision Optoelectronic Instrument Engineering Center, Harbin Institute of Technology, Harbin 150001, Heilongjiang, China
    Opt Express 20:19206-13. 2012
    ..21% when the dipole is oriented along Z axis...
  4. doi request reprint Rigorous theory on elliptical mirror focusing for point scanning microscopy
    Jian Liu
    Ultra precision Optoelectronic Instrument Engineering Center, Harbin Institute of Technology, No 92, West Da Zhi Street, Harbin 150001, Heilongjiang, China
    Opt Express 20:6175-84. 2012
    ....
  5. doi request reprint Vectorial design of super-oscillatory lens
    Tao Liu
    Center of Ultra Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150001, China
    Opt Express 21:15090-101. 2013
    ..The proposed vectorial design method can be used to efficiently design a SOL of arbitrary size illuminated by various vector beams, with the subwavelength hotspot located in a post-evanescent observation plane...
  6. doi request reprint Confocal simultaneous phase-shifting interferometry
    Chenguang Zhao
    Center of Ultra Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, China
    Appl Opt 50:655-61. 2011
    ..The reflectivity disturbance resistibility of C-SPSI was demonstrated by imaging a typical microcircuit specimen. C-SPSI breaks through the restriction of low NA on the axial depth resolution of confocal microscopy effectively...